SPIE Profiles

SPIE Profiles is a networking platform for optics and photonics professionals

Thomas Race Xerox Corporation Individual Member	Prof. Wim Bogaerts Ghent University - IMEC Senior Member	Prof. Arash Darafsheh Washington Univ. School of Medicine in St. Louis Senior Member
Dr. John Kerekes Rochester Institute of Technology Senior Member	Dr. Bryan Barnes National Institute of Standards and Technology Senior Member	Prof. Zhihong Zhang Huazhong University of Science and Technology Senior Member

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