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25 - 30 January 2025
San Francisco, California, US
Conference 13365 > Paper 13365-26
Paper 13365-26

Effects of AlN film thickness and operating frequency on sensing output of CO2 pyroelectric-based non-dispersive infrared gas sensor

28 January 2025 • 2:05 PM - 2:25 PM PST | Moscone West, Room 2024 (Level 2)

Abstract

CMOS compatible AlN-based pyroelectric detectors of different thicknesses (500nm and 1μm respectively) are examined by measuring their responses to different concentrations of CO2 gas in an NDIR gas sensing system. We note up to ~55% improvement in signal when AlN thickness reduces from 1μm to 500nm. In addition, we design our AlN-based pyroelectric detectors similar to 2 capacitors connected in series and 4 capacitors connected in series while keeping the total pyroelectric sensing layer constant. CO2 sensing responses of both designs with AlN thicknesses of 500nm and 1μm are measured in the NDIR gas sensing system and the 2-capacitor design with 500nm thick AlN in general gives a more sensitive response. The LOD for CO2 sensing when using this detector is extracted based on Beer-Lambert law and we obtain an LOD of ~53ppm. As pyroelectric detectors are known to operate at lower frequencies (~tens of hertz), we also operate the detectors at different modulating frequencies (7Hz, 11Hz and 17.4Hz) and observe their effects on the gas sensing signal. Comparing the 4 different detectors in NDIR gas sensing, the AlN-based pyroelectric detector with 500nm thick AlN and of 2-capacitor design presents the best performance in CO2 gas sensing. This work shows effects of AlN film thickness change and variation in operating frequency on pyroelectric-based NDIR CO2 gas sensing. The results will provide more understanding on characteristics of AlN-based pyroelectric detectors and their behaviours in NDIR gas sensing.

Presenter

A*STAR Institute of Microelectronics (Singapore)
Application tracks: Sustainability
Author
A*STAR Institute of Microelectronics (Singapore)
Author
Kristel Pei Xuan Wee
A*STAR Institute of Microelectronics (Singapore)
Author
A*STAR Institute of Microelectronics (Singapore)
Author
Landobasa Tobing
A*STAR Institute of Microelectronics (Singapore)
Author
A*STAR Institute of Microelectronics (Singapore)
Author
Isaac Siyuan Ling
A*STAR Institute of Microelectronics (Singapore)
Author
A*STAR Institute of Microelectronics (Singapore)
Author
A*STAR Institute of Microelectronics (Singapore)
Author
A*STAR Institute of Microelectronics (Singapore)
Author
A*STAR Institute of Microelectronics (Singapore)
Author
A*STAR Institute of Microelectronics (Singapore)
Presenter/Author
A*STAR Institute of Microelectronics (Singapore)