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2015 SPIE Smart Structures/NDE | Call for Papers

SPIE Sensing Technology + Applications | Call for Papers

Optical Engineering

SPIE PRESS



Sensing & Measurement

A novel way to detect latent flaws
Stress-induced light scattering can identify micro/nanoscale cracks caused by fine polishing.
Airy light fields, with their unique transversal structures, offer new possibilities for 3D imaging by light sheet microscopy.
18 July 2014
A new label-free 3D imaging method using a commercial microscope and a quantitative phase imaging module reveals cellular structures of live cells with submicron resolution.
11 July 2014
A simple and low-cost direct laser writing technique using an ultralow linear absorption process enables production of specific 2D and 3D sub-microstructures.
9 July 2014
Techniques for reliable estimation of phase and its derivatives enable optical metrology with high estimation accuracy, good computational efficiency, and robustness against noise.
8 July 2014
The integration of photon-number-resolving detectors based on an array of niobium nitride nanowires into quantum photonic integrated circuits shows promise for future quantum computing applications.
7 July 2014
Commercial sales up at FLIR Systems
But the thermal imaging giant reports an overall slowdown in sales following its restructuring.
24 July 2014
Sales and orders rise strongly at Trumpf
Preliminary figures from the machine tool and laser company show order growth of 16 per cent.
24 July 2014
European Commission publishes ICT 2015 call
Photonics element of Horizon 2020 focuses on data centers, laser-based manufacturing and photonic integrated circuits.
24 July 2014
Organic image sensor start-up eyes mass production
Grenoble-based ISORG has raised €6.4M in its latest round of venture finance.
23 July 2014
 
John Asmus: Optical techniques and the mysterious Mona Lisa

SCHOTT MORITEX