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As researchers race to develop novel semiconductors that efficiently split water to produce hydrogen, nanotechnology is providing winning solutions.
Critical dimension inspection based on a library of simulated through-focus diffraction patterns and a mechanical-free defocusing process could improve high-throughput quality control.
A pre-processing procedure can diminish the data noise from new-generation hyperspectral sensors, thus minimizing negative impacts on target detection algorithms.
Allied Vision Technologies GmbH