26 - 29 June 2023
Munich, Germany
Conference 12619 > Paper 12619-32
Paper 12619-32

Modeling the topographic lateral resolution of interferometers (Invited Paper)

On demand | Presented live 28 June 2023

Abstract

Performance characteristics for interferometers that measure surface topography include the ability to resolve closely spaced surface features, referred to as topographic spatial resolution. Within well-defined limits, scalar diffraction theory and classical Fourier optics provide a software model for prediction of the resolution and spatial frequency response for interference phase-based measurements of surface topography. Analytical solutions and adaptive sampling allow for rapid simulation of both the nominal linear transfer function and an estimate of intrinsic residual nonlinearities.

Presenter

Zygo Corporation (United States)
Peter de Groot is a Physics PhD specializing in applied optics and distance, form and texture measurements. His research has led to 145 US patents and 200 technical papers, tutorials and book chapters. He is currently Chief Scientist at Zygo Corporation, and the 2023 SPIE Vice President.
Presenter/Author
Zygo Corporation (United States)
Author
Zygo Corporation (United States)
Author
Southern Connecticut State Univ. (United States)