Technology being presented at SPIE Optical Metrology

Optical Metrology technical conferences

Come ready to discuss the latest research in measurement systems, modeling, videometrics, and inspection

Featuring six technical conferences


Thank you to our 2023 Optical Metrology Chairs


Marc P. Georges

Univ. de Liège (Belgium)

Jörg Seewig

Technische Univ. Kaiserslautern (Germany)