SPIE Optical Metrology technical conferences

The premier European conference for scientists, engineers, researchers, and product developers
Technology being presented at SPIE Optical Metrology

Optical Metrology technical conferences

Come ready to discuss the latest research in measurement systems, modeling, videometrics, and inspection

Proceedings volumes for Optics + Optoelectronics 2021


Research to advance your work

All paid conference registrations include one volume for ongoing access. Preview the list of available research.

Thank you to our 2021 Optical Metrology Chairs


SPIE Optical Metrology Symposium Chair Marc P. Georges

Univ. de Liège (Belgium)

Jörg Seewig

Technische Univ. Kaiserslautern (Germany)

2021 Technical Committee


Armando Albertazzi Goncalves, Jr., Univ. Federal de Santa Catarina (Brazil)
Bryan M. Barnes, National Institute of Standards and Technology (United States)
Jürgen Beyerer, Fraunhofer-Institut für Optronik, Systemtechnik und Bildauswertung IOSB and Karlsruher Institut für Technologie (Germany)
Bernd Bodermann, Physikalisch-Technische Bundesanstalt (Germany)
Pietro Ferraro, CNR - Institute of Applied Sciences and Intelligent Systems (Italy)
Karsten Frenner, Univ. Stuttgart (Germany)
Simonetta Grilli, CNR - Institute of Applied Sciences and Intelligent Systems (Italy)
Roger Groves, Technische Univ. Delft (Netherlands)
Michael Heizmann, Karlsruher Institut für Technologie (Germany)
Christoph Hitzenberger, Medizinische Univ. Wien (Austria)
Peter Lehmann, Univ. Kassel (Germany)
Haida Liang, Nottingham Trent Univ. (United Kingdom)
Wolfgang Osten, Univ. Stuttgart (Germany)
Monika Ritsch-Marte, Medizinische Univ. Innsbruck (Austria)
Ettore Stella, Univ. de Bari and CNR - Institute of Applied Sciences and Intelligent Systems (Italy)