Optical Metrology programme

A powerful week of conferences and special events

Learn about the programme

As we build a successful programme for the next event, you'll find links to plenary sessions, conference presentations, and networking events to create an incredible event experience.

Experts address a variety of technologies and applications:

  • Optical measurement systems
  • Modeling aspects
  • Optical methods for inspection, characterization, and imaging of biomaterials
  • Multimodal sensing
  • Automated visual inspection and machine vision
  • Optics for arts, architecture, and archaeology (OA3)

Don't miss world-class plenary and keynote speakers


Peter J. de Groot, Zygo Corporation (United States)

Peter J. de Groot

Zygo Corporation (United States)

Hiroki Kikuch, Sony Group Corporation R&D Center (Japan)

Hiroki Kikuchi

Sony Group Corporation R&D Center (Japan)

Lynford L. Goddard, Univ. of Illinois (United States)

Lynford L. Goddard

Univ. of Illinois (United States)

Claudia Conti, CNR-ISPC (Italy)

Claudia Conti

CNR-ISPC (Italy)

Adam P. Wax, Duke Univ. (United States)

Adam P. Wax

Duke Univ. (United States)

Saoucene Hassad, Lab. d'Acoustique de l'Univ. du Maine, CNRS (France)

Saoucene Hassad

Lab. d'Acoustique de l'Univ. du Maine, CNRS (France)

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