18 - 22 August 2024
San Diego, California, US
Conference 13111 > Paper 13111-80
Paper 13111-80

Deterministic fabrication of sharp amorphous silicon oxide nanocones using a single mask

19 August 2024 • 5:30 PM - 7:00 PM PDT | Conv. Ctr. Exhibit Hall A

Abstract

Nanocones with tapered sidewalls exhibit extraordinary and versatile optical properties such as anti-reflection, super-absorption, and supertransmissivity. We present a single-mask dry etching technique for the fabrication of amorphous silicon oxide nanocones featuring sharp tips, smooth sidewalls, and deterministic distribution onto substrates. We demonstrate high aspect ratio nanocones with sidewalls of constant angle and tip diameters limited mainly by the resolution of electron beam lithography. We further introduce a single-mask, multi-step dry etching approach to fabricate ultra-sharp silicon oxide nanocones with tip diameters as small as 10 nanometers by undercutting nanopillars at mid-height, enabling the etching of multi-height nanocones onto a substrate using a single etch. The presented processes introduce exciting possibilities, including the fabrication of transparent dielectric nanocone distributions onto unconventional films and substrates when fused silica and thermally oxidized silicon are unavailable. The presented findings have applications in nanophotonics and strain engineering of two-dimensional materials.

Presenter

Xi Wang
Univ. of Delaware (United States)
Dr. Xi Wang is currently an assistant professor in the Department of Materials Science and Engineering at the University of Delaware. Dr. Xi Wang received his PhD in Electrical Engineering from the State University of New York at Buffalo in 2014 and B.S. degree in Microelectronics from Tsinghua University in 2007. Dr. Xi Wang was a postdoctoral scholar at the University of California, Berkeley, before he started his appointment at UD in 2018. Dr. Xi Wang’s research focuses on the area of nanophotonics, nanomaterials, and tunable nanophotonic devices.
Presenter/Author
Xi Wang
Univ. of Delaware (United States)
Author
Univ. of Delaware (United States)