Share your research in Munich. The 2025 Call for Papers is now open.
SPIE Optical Metrology highlights the the latest advances in optical measurement systems. It is the meeting for emerging photonics fields within measurement systems, modeling, imaging, sensing, and inspection.
The abstracts due date has been extended to 17 February 2025. Make plans to present and share your research at this year's conference.
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Univ. de Liège (Belgium)
Technische Univ. Kaiserslautern (Germany)
Your registration to SPIE Optical Metrology, grants you admission to all conferences held as part of the LASER World of Photonics Congress.
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