Paper 13139-26
Paper 13139-26
Micro-area ultrafast spectroscopy and the application (Invited Paper)
19 August 2024 • 11:55 AM - 12:20 PM PDT | Conv. Ctr. Room 11B
Abstract
Ultrafast spectroscopy imaging is an important technical means for the characterization of charge carriers, which are widely used in the fields of materials, information, physics and chemistry. In recent years, we have been committed to developing spectral measurement systems with spatial, temporal, and momentum resolution capabilities, studying the carrier characteristics in semiconductor material systems, and laying an important foundation for a deeper understanding of their photoelectric properties and related devices. In this talk, I mainly introduce some progress based on micro/nanoscale ultrafast spectroscopy imaging in the study of carrier mobility, electron phonon coupling, as well as the spectral characteristics and related carrier dynamics of nanoscale semiconductor materials induced by the edges.
Presenter
Xinfeng Liu
National Ctr. for Nanoscience and Technology (China)
Dr. Xinfeng Liu, Project Leader, Deputy Director of the Key Laboratory of Nano-characterization and Standardization of the Chinese Academy of Sciences, National Center for Nanoscience and Technology of China (NCNST). He graduated from Northeast Normal University in 2007, and obtained the doctoral degree from the National Nanoscience Center in 2011, and engaged in postdoctoral research at Nanyang Technological University in Singapore from 2011 to 2105. His research field is focusing on the study of high spatial and temporal resolution ultrafast dynamics and related physical and chemical properties. In recent years, he published more than 250 research papers in Science, Nat. Mater, Sci Adv., Nat. Commun, etc. with total citations over 20000. He served as peer reviewer for Nat. Nanotech, Sci. Adv. Nat. Commun. He also severed as member of the editorial board of Journal of Physics: Photonics, Frontiers of Physics, InfoMat, and Youth Editorial Board of Materials Today Physics.