18 - 22 August 2024
San Diego, California, US
Conference 13134 > Paper 13134-39
Paper 13134-39

Dynamic compensation of phase step using an LCD

19 August 2024 • 5:30 PM - 7:00 PM PDT | Conv. Ctr. Exhibit Hall A

Abstract

This paper describes a process for measuring a thin film of MgF2 using an LCD to compensate for experimental interferograms in a Twyman-Green arrangement. The process involves generating different gray levels to display a controlled distribution on an LCD pixel by pixel. Each gray level has been calibrated and associated with a phase value. The objective is to obtain contiguous bands in all interferograms, which can be achieved by sectioning the screen into several gray levels. The proposal can also be used to compensate for the profile of an arbitrary surface with manufacturing errors.

Presenter

Reyna Cornelio de Jesus
Instituto Nacional de Astrofísica, Óptica y Electrónica (Mexico)
She was born in Hermosillo, Sonora, Mexico in 1993. Since I was a child, she has been interested in everything that has to do with nature and how to explain the phenomena that occur, so She studied for a degree in Physics at the University of Sonora. During my stay at the university, I participated in the National Congress of Physics in its various venues for several years. She started I graduate studies at the National Institute of Optical and Electronic Astrophysics (INAOE) in 2020. She is currently starting Her PhD in optics at the same institute. Her main goal is to create a tool to help society with current problems. She has been training at INAOE, acquiring the knowledge of Her advisors and colleagues to carry it out.
Application tracks: AI/ML
Presenter/Author
Reyna Cornelio de Jesus
Instituto Nacional de Astrofísica, Óptica y Electrónica (Mexico)
Author
Instituto Nacional de Astrofísica, Óptica y Electrónica (Mexico)
Author
M. Elizabeth Percino-Zacarías
Instituto Nacional de Astrofísica, Óptica y Electrónica (Mexico)
Author
Bartolome Ramírez-Reyes
Instituto Nacional de Astrofísica, Óptica y Electrónica (Mexico)
Author
Instituto Nacional de Astrofísica, Óptica y Electrónica (Mexico)
Author
Instituto Nacional de Astrofísica, Óptica y Electrónica (Mexico)
Author
Instituto Nacional de Astrofísica, Óptica y Electrónica (Mexico)