16 - 21 June 2024
Yokohama, Japan
Conference 13103 > Paper 13103-15
Paper 13103-15

DR-TES & 511-CAM missions: Transition-edge sensor microcalorimeter detectors for pointed X-ray and Gamma-ray missions

16 June 2024 • 15:00 - 15:20 Japan Standard Time | Room G312/313, North - 3F

Abstract

The new generation of X-ray and gamma-ray detectors employ cryogenic detectors known as transition-edge sensors (TES) due to their high energy resolution and photon detection rates. These detectors require a refrigeration module that can operate at the transition temperature of the TES’s superconducting film—usually at mK temperatures. DR-TES consists of a novel mini-dilution refrigerator (DR) from Chase Research Cryogenics that can be used in balloon-borne missions to cool detectors to temperatures between 10-100 mK. To test the viability of this DR module, we will be cooling down a SLEDGEHAMMER detector fabricated by the National Institute of Standards and Technology quantum sensor group. The SLEDGEHAMMER microcalorimeter uses TESs coupled to superconducting quantum interference devices which are in turn coupled to microwave resonators to detect X-rays and gamma-rays. We plan to fly the SLEDGEHAMMER detector cooled by the mini-DR on a stratospheric balloon flight in August of 2024 at Fort Sumner, NM. As a follow-up mission, 511-CAM will use a modified version of the detector to map the 511 keV emission from the galactic center region.

Presenter

Nicole Rodriguez Cavero
Washington Univ. in St. Louis (United States)
Nicole is a fourth-year physics Ph.D. candidate at the Washington University in St. Louis working with Dr. Henric Krawczynski on high-energy astrophysics. Her group develops balloon-borne missions: XL-Calibur, which examines the X-ray polarization signatures from various astrophysical sources, as well as DR-TES, a state-of-the-art cryogenic gamma-ray detector.
Application tracks: Astrophotonics
Presenter/Author
Nicole Rodriguez Cavero
Washington Univ. in St. Louis (United States)
Author
Washington Univ. in St. Louis (United States)
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Ephraim Gau
Washington Univ. in St. Louis (United States)
Author
Washington Univ. in St. Louis (United States)
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Clemson Univ. (United States)
Author
Washington Univ. in St. Louis (United States)
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Daniel T. Becker
National Institute of Standards and Technology (United States)
Author
National Institute of Standards and Technology (United States)
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Sohee Chun
Washington Univ. in St. Louis (United States)
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Douglas A. Bennet
National Institute of Standards and Technology (United States)
Author
Washington Univ. in St. Louis (United States)
Author
Washington Univ. in St. Louis (United States)
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Washington Univ. in St. Louis (United States)
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Washington Univ. in St. Louis (United States)
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Johnathon D, Gard
National Institute of Standards and Technology (United States)
Author
National Institute of Standards and Technology (United States)
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Fabian Kislat
The Univ. of New Hampshire (United States)
Author
Washington Univ. in St. Louis (United States)
Author
National Institute of Standards and Technology (United States)
Author
Washington Univ. in St. Louis (United States)
Author
National Institute of Standards and Technology (United States)
Author
National Institute of Standards and Technology (United States)
Author
National Institute of Standards and Technology (United States)
Author
Washington Univ. in St. Louis (United States)