Paper 13093-171
ASIC design evolution of ATHENA X-IFU warm front-end electronics
On demand | Presented live 17 June 2024
Abstract
This paper gives a review of the ASIC design evolutions of the WFEE in the context of the ATHENA mission. The development follows the evolutions of the X-IFU instrument detection chain and secures the ASIC technology access continuity by using an ST SiGe 130 nm technology instead of the previous use of an AMS SiGe 350 nm node. First ASIC prototypes based on this ST 130 nm SiGe technology have been developed to answer these technical challenges and meet the new requirements. This paper will give a brief review of these ASICs dedicated to the WFEE.
Presenter
Astroparticule et Cosmologie (France)
Si CHEN, research engineer at the APC laboratory. He obtained his Ph.D. in micro-electronic instrumentation at the University of Paris in 2019. He specializes in low-noise analogue circuits and full-custom radiation-hardened digital circuits based on SiGe BiCMOS technologies. Since 2016, he has been working on the development of mixed ASICs dedicated to an electronic subsystem, the WFEE, which is the warm front-end stage in the reading chain of the X-IFU instrument in the context of the X-ray space mission - ATHENA.