Share Email Print


Recent Developments in Traceable Dimensional Measurements III

*This item is only available on the SPIE Digital Library. external link icon

Volume Details

Volume Number: 5879
Date Published: 18 August 2005

Table of Contents
show all abstracts | hide all abstracts
All links to SPIE Proceedings will open in the SPIE Digital Library. external link icon
Accurate extraction of thermal expansion coefficients and their uncertainties from high precision interferometric length measurements
Author(s): R. Schoedel
Show Abstract
Nanometrology and high-precision temperature measurements under varying in time temperature conditions
Author(s): Alexandre Titov; Igor Malinovsky
Show Abstract
Uncertainty evaluation of a fiber-based interferometer for the measurement of absolute dimensions
Author(s): Vivek G. Badami; Todd Blalock
Show Abstract
Precise certification of the temperature measuring system of the original Koesters interferometer and ways of its improvement
Author(s): Alexander Titov; Igor Malinovsky; Madlen Erin; Hakima Belaidi; Ricardo dos Santos Franca
Show Abstract
Automatic measurement of gauge blocks by Fourier transforming the scanned interferograms
Author(s): Chu-Shik Kang; Jae Wan Kim; Ho Suhng Suh; Won-Kyu Lee
Show Abstract
The effect of phase change on reflection on optical measurements
Author(s): Kate M. Medicus; Anneliese Fricke; John Edward Brodziak Jr.; Angela D. Davies
Show Abstract
On the influence of gauge block roughness characteristic and surface treatment on length calibration by optical interferometry
Author(s): Jennifer E. Decker; Peter Franke; Gerhard Boensch
Show Abstract
Characterising the performance of the PTB line scale interferometer by measuring photoelectric incremental encoders
Author(s): Rainer Koening; Jens Fluegge; Harald Bosse
Show Abstract
Systematic bias compensation for a moire fringe projection system
Author(s): D. Purcell; A. Samara; A. Davies; F. Farahi
Show Abstract
Gaussian beam modeling of the radius of curvature
Author(s): Kate M. Medicus; James Snyder; Angela D. Davies
Show Abstract
Radius case study: optical bench measurement and uncertainty including stage error motions
Author(s): Tony L. Schmitz; Neil Gardner; Matthew Vaughn; Angela Davies
Show Abstract
Low-cost precision rotary index calibration
Author(s): T. W. Ng; T. S. Lim
Show Abstract
Bootstrap calibration of an autocollimator, index table and sine bar ensemble for angle metrology
Author(s): James R. Pekelsky; Lorne E. Munro
Show Abstract
A primary roundness measuring machine
Author(s): Ruedi Thalmann; Juerg Spiller
Show Abstract
Dynamic range enhancing technique for form, waviness and roughness measurements using fringe projection
Author(s): Ayman Samara; Faramarz Farahi; Angela Davies
Show Abstract
Size effects on stylus tip reconstruction for micro and nano roughness measurement
Author(s): Chao-Chang A. Chen; Jr-Rung Chen; Huay-Chung Liou; Yen-Liang Chen
Show Abstract
Accurate roughness measurements by laser interferometer calibration, VFM-uncertainty calculations and noise reduction
Author(s): H. Haitjema; M. A. A. Morel
Show Abstract
Use of monochromatic phase data for improved profile measurement in spectrally resolved white light interferometry
Author(s): S. K. Debnath; D. K. Sharma; M. P. Kothiyal
Show Abstract
Multi-purpose extrinsic Fabry-Perot sensor with miniature dual fiber configuration
Author(s): Jung-Tsung Chou; Chiung-Huei Huang; Ching-Ming Yeh; Calvin C. Chang; Hung-Ming Tai
Show Abstract
Absolute distance metrology with frequency sweeping interferometry
Author(s): Alexandre Cabral; Jose Rebordao
Show Abstract
The detection of cyclic nonlinearities in a ZMI2000 heterodyne interferometer
Author(s): Jorrit Thijsse; Asa K. Jamting; Nick Brown; Han Haitjema
Show Abstract
Absolute distance metrology for space interferometers
Author(s): Bas L. Swinkels; Abdelhalim Latoui; Nandini Bhattacharya; Arno A. Wielders; Joseph J. M. Braat
Show Abstract
Linear Canonical Transforms, and Speckle Based Metrology
Author(s): Damien P. Kelly; Robert F. Patten; Bryan M. Hennelly; Ying Liu; Jennifer E. Ward; John T. Sheridan
Show Abstract
Network compensation of optical metrology for satellite formation flying
Author(s): Paulo Jorge Motrena; Jose Manuel Rebordao; Alexandre Pereira Cabral
Show Abstract
Performance assessment of involute gear measurement by CMM using a double-ball artifact
Author(s): Toshiyuki Takatsuji; Koshi Kondo; Aizo Kubo; Frank Haertig; Sonko Osawa; Kazuya Naoi; Tomizo Kurosawa; Masaharu Komori
Show Abstract
A fiber probe for CMM measurements of small features
Author(s): Jack A. Stone; Bala Muralikrishnan; John R. Stoup
Show Abstract
Ultra precision micro-CMM using a low force 3D touch probe
Author(s): F. Meli; A. Kueng; R. Thalmann
Show Abstract
Design and calibration of an elastically guided CMM axis with nanometer repeatability
Author(s): J. K. van Seggelen; P. C.J.N. Rosielle; P. H. J. Schellekens; H. A.M. Spaan; R. H. Bergmans; G. J. W. L. Kotte
Show Abstract
First domestic comparison of ball plate calibration in Japan
Author(s): Sonko Osawa; Toshiyuki Takatsuji; Tomizo Kurosawa
Show Abstract
Methods for evaluating the reference value in laboratory intercomparisons of dimensional measurements
Author(s): Jack A. Stone
Show Abstract
A new approach to determining the key comparison reference value
Author(s): N. Brown
Show Abstract
Phase-shifting laser diode interferometry with equal phase steps using a Fabry-Perot cavity
Author(s): Youichi Bitou; Hajime Inaba; Feng-Lei Hong; Toshiyuki Takatsuji; Atsushi Onae
Show Abstract
Calibration of two-dimensional nanometer gratings using optical diffractometer and metrological atomic force microscope
Author(s): Jong-Ahn Kim; Jae Wan Kim; Byong Chon Park; Tae Bong Eom; Chu-Shik Kang
Show Abstract
A comparison study on the measurement of nanoparticles
Author(s): Chen-Yu Wang; Shan-Peng Pan; Gwo-Sheng Peng; Jen-Hui Tsai
Show Abstract
A novel Michelson interferometer combined with an autocollimator for the simultaneous measurement of linear and angular displacement
Author(s): Jae Wan Kim; Jong-Ahn Kim; Chu-Shik Kang; Tae Bong Eom
Show Abstract
Development of a two-dimensional nano-displacement measuring system utilizing a combined optical and x-ray interferometer
Author(s): Jinwon Park; Jaegeun Jo; Sangho Byun; Cheon Il Eom
Show Abstract
A new approach of surface roughness measurement using optical method and image processing
Author(s): K. P. Chaudhary; R. P. Singhal; Shashi K. Singh; Chandera Shakher
Show Abstract

© SPIE. Terms of Use
Back to Top
Sign in to read the full article
Create a free SPIE account to get access to
premium articles and original research