Garry Tuohy

Tuohy, Garry
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SPIE Membership: 1.7 years
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Area of Expertise: Semiconductors, Inspection, Metrology, Statistics, Database, Machine Learning
Social Media: LinkedIn
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Profile Summary

Garry Tuohy received the B.Sc.(Hons.) degree in applied physics from the University of Salford, Greater Manchester, UK, in 1994.

He started working in the Semiconductor Industry in 1996 and since 2003 he has worked in Dresden, Germany for AMD (Yield Engineering) and currently for GLOBALFOUNDRIES (Defect Reduction Systems), where he is a Member of Technical Staff.

His work primarily involves developing database and web applications for kill ratio calculation, yield loss prediction, signature visualization and predictive maintenance. He is a Fellow of the Royal Statistical Society and a member of the IEEE.

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