Dr. Robert Kowarsch

SPIE Leadership: Retrieving Data, please wait...
SPIE Membership: 3.9 years
Area of Expertise: Optical metrology, Label-free superresolution microscopy, Laser-Doppler vibrometry, Confocal scanning microscopy
Websites: Company Website
Social Media: LinkedIn
Contact Details:
Sign In to send a private message or view contact details

Upcoming Presentations

Most Recent | Show All
Retrieving Data, please wait...

Publications

Most Recent | Show All
Retrieving Data, please wait...
PREMIUM CONTENT
Sign in to read the full article
Create a free SPIE account to get access to
premium articles and original research
Create an SPIE account