Dr. Myungjun Lee

Individual Member | Samsung Electronics Co Ltd
Lee, Myungjun
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SPIE Membership: 3.9 years
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Profile Summary

Myungjun Lee received his Ph.D degree in electrical computer engineering/optical science from University of Arizona in 2010, a master degree from Texas A&M University in 2005, and a bachelor degree from Korea University in 2002. From 2010 to 2011, he was a postdoctoral fellow at UCLA working on computational imaging technique (Ozcan's Lab).

Now, he is the head of inspection solution group at Samsung Electronics, leading to develop the current & next-generation metrology and inspection systems needed for semiconductor chip manufacturing. Prior to joining Samsung, he was the member of 5D division at KLA-Tencor, Strategic Lithography Team at GlobalFoundries (Also, pathfinding patterning team at IBM) in Albany, NY, to develop advanced patterning and metrology solutions.

He has authored/co-authored > 40 journal and conference papers, and holds > 20 US patents in various optical systems and applications for imaging, sensing, communications, semiconductor patterning and metrology.

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