Dr. Myungjun Lee

Senior Member | Head of Group, Samsung Electronics
Lee, Myungjun
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SPIE Membership: 5.6 years
SPIE Awards: Senior status
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Area of Expertise: Computational optics, Optical Metrology and inspection, Lithography, Scatterometry, Holographic imaging, Nonlinear optics
Social Media: LinkedIn
ORCID iD: https://orcid.org/0000-0002-4583-1575
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Profile Summary

Myungjun Lee received his Ph.D degree in electrical computer engineering/optical science from University of Arizona (under Prof. Mark A. Neifeld) in 2010, a master degree from Texas A&M University (under Prof. Henry F. Taylor) in 2005, and a bachelor degree from Korea University in 2002. From 2010 to 2011, he was a postdoctoral fellow at UCLA working on computational imaging techniques under Prof. Aydogan Ozcan.

Currently, he is the head of inspection solution group at Samsung Electronics, leading the development of the current & next-generation metrology and inspection systems needed for semiconductor chip manufacturing. Prior to joining Samsung, he worked for several companies including KLA-Tencor, Strategic Lithography Team at GlobalFoundries (Also, pathfinding patterning team at IBM), and Nanometrics to develop various patterning and metrology solutions.

He has authored/co-authored 50+ journal and conference papers, and holds 40+ US patents in various optical system designs and their applications for imaging, sensing, communications, semiconductor patterning and metrology.

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