Dr. Myungjun Lee

Individual Member | Samsung Electronics Co Ltd
Lee, Myungjun
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SPIE Membership: 3.0 years total | 3.0 years voting
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Profile Summary

Myungjun Lee is the head of inspection solution group at Samsung. Before joining Samsung, he had been working for KLA, GlobalFoundries, and Nanometrics to find advanced patterning and metrology solutions.

He was a Post-Doc scholar in Electrical Engineering Department at UCLA, where he studied computational Imaging techniques. He received his Ph.D in Optics at the University of Arizona and Master degree from Texas A&M University and Bachelor degree from Korea University.

He published 39 journal and conference papers and filed over 15 patents in the area of optics for various imaging, sensing, semiconductor applications.

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