SPIE Optical Metrology

Build your programme

On this page you'll find links to live plenary sessions, on-demand conference presentations, and networking events to build your ultimate event experience.

Experts address a variety of technologies and applications:

Optical measurement systems
Modeling aspects in optical metrology
Optics for arts, architecture, and archaeology
Multimodal sensing and artifical intelligence techologies and applications
Optical methods for inspection, characterization, and imaging of biomaterials
Automated visual inspection and machine vision

Technology presented at SPIE Optical Metrology

Don't miss world-class plenary and keynote speakers

Zeev Zalevsky

Bar-Ilan Univ. (Israel)

Tammy Ma (World of Photonics plenary speaker)

Constantine L. Häfner (World of Photonics plenary speaker)

Fraunhofer-Institute for Laser Technology (Germany)