• Optical Metrology
Internationales Congress Center
Munich, Germany
21 - 25 June 2015
Print PageEmail Page

SPIE Optical Metrology 2015

Munich, Germany

Thank you to all of those who participated at SPIE Optical Metrology, the premier European conference to meet with scientists, engineers, researchers, and product developers to discuss the latest research in measurement systems, modeling, videometrics, and inspection. Co-located with ECBO.

Review the 2015 Programme
 • Onsite news and photos
 • Final Technical Programme (2 MB PDF)
 • Technical Abstracts (1 MB PDF)

Sign up for email updates to receive important reminders about this event.

BBC News - Science & Environment: 20 January 2015
X-ray technique reads burnt Vesuvius scroll
For the first time, words have been read from a burnt, rolled-up scroll buried by Mount Vesuvius in AD79.

2015 Conference Topics:
 • Optical Measurement Systems for Industrial Inspection
 • Modeling Aspects in Optical Metrology
 • O3A: Optics for Arts, Architecture, and Archaeology
 • Videometrics, Range Imaging, and Applications
 • Optical Methods for Inspection, Characterization, and Imaging of Biomaterials
 • Automated Visual Inspection and Machine Vision

SPIE Optical Metrology is part of:

SPIE conference papers are published in the Proceedings of SPIE and available via the SPIE Digital Library, the world’s largest collection of optics and photonics research.  

The Proceedings are indexed in Web of Science, Scopus, Ei Compendex, Inspec, Google Scholar, Astrophysical Data System (ADS), DeepDyve, ReadCube, CrossRef, and other scholarly indexes, and are widely accessible to leading research organizations, conference attendees, and individual researchers. 

Cooperating Organisations

 European Optical Society

Browse SPIE Proceedings from Optical Metrology

Sign up for event e-alerts