Internationales Congress Center Munich,
Germany 26 - 29 June 2017
The 2017 Call for Papers is now open
Present a paper at SPIE Optical Metrology 2017, the premier European conference bringing together scientists, engineers, researchers, and product developers engaged in all aspects of optical metrology.
Co-located with Laser World of Photonics 2015 in Munich, Germany, this symposium provides an excellent opportunity to connect with engineers, researchers, and developers from Europe and beyond.
SPIE conference papers are published in the Proceedings of SPIE and available via the SPIE Digital Library, the world’s largest collection of optics and photonics research.
The Proceedings are indexed in Web of Science, Scopus, Ei Compendex, Inspec, Google Scholar, Astrophysical Data System (ADS), DeepDyve, ReadCube, CrossRef, and other scholarly indexes, and are widely accessible to leading research organizations, conference attendees, and individual researchers.
Abstracts Due 19 December 2016
Author Notification 18 Feburary 2017
On-site Manuscripts Due 15 April 2017
Post-meeting Manuscripts Due (O3A Conference only) 27 May 2017