• Optical Metrology
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Internationales Congress Center
Munich, Germany
26 - 29 June 2017
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Plan for SPIE Optical Metrology 2017 in Munich

Munich, Germany

SPIE Optical Metrology 2017, the premier European conference bringing together scientists, engineers, researchers, and product developers engaged in all aspects of optical metrology.

Call for Papers (PDF)

Call for Papers 2017
 • See the list below to submit a paper online
 • 2017 Call for Papers PDF (1 MB PDF)
2017 Conference Topics:
 • Optical Measurement Systems for Industrial Inspection
 • Modeling Aspects in Optical Metrology
 • O3A: Optics for Arts, Architecture, and Archaeology
 • Videometrics, Range Imaging, and Applications
 • Optical Methods for Inspection, Characterization, and Imaging of Biomaterials
 • Automated Visual Inspection and Machine Vision

Review the 2015 Programme
 • Onsite news and photos
 • Final Technical Programme (2 MB PDF)
 • Technical Abstracts (1 MB PDF)

Co-located with Laser World of Photonics 2017 in Munich, Germany, this symposium provides an excellent opportunity to connect with engineers, researchers, and developers from Europe and beyond.

SPIE conference papers are published in the Proceedings of SPIE and available via the SPIE Digital Library, the world’s largest collection of optics and photonics research.  

The Proceedings are indexed in Web of Science, Scopus, Ei Compendex, Inspec, Google Scholar, Astrophysical Data System (ADS), DeepDyve, ReadCube, CrossRef, and other scholarly indexes, and are widely accessible to leading research organizations, conference attendees, and individual researchers. 

Cooperating Organisations

 European Optical Society

Important Dates

Abstracts Due
19 December 2016

Author Notification
18 Feburary 2017

On-site Manuscripts Due
15 April 2017

Post-meeting Manuscripts Due
(O3A Conference only)
27 May 2017

Browse Defense, Security, and Sensing 2011 papers

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