• Optical Metrology
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Internationales Congress Center
Munich, Germany
24 - 27 June 2019
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Plan now for SPIE Optical Metrology 2019

SPIE Optical Metrology 2019

Join us in Munich 
Present your research at SPIE Optical Metrology, the premier European conference where scientists, engineers, researchers, and product developers gather to discuss the latest research in measurement systems, modeling, multimodal sensing, and inspection. 

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Abstracts due 
9 January 2019

Author notification
26 February 2019

Quick links

Browse the 2019 Online Call for Papers
Review the submission guidelines
Download the Call for Papers PDF

2019 Conference topics

 • Optical Measurement Systems for Industrial Inspection
 • Modeling Aspects in Optical Metrology
 • Optical Methods for Inspection, Characterization, and Imaging of Biomaterials
 • Multimodal Sensing: Technologies and Applications NEW
 • Automated Visual Inspection and Machine Vision
 • O3A: Optics for Arts, Architecture, and Archaeology

SPIE Optical Metrology is part of

World of Photonics Congress

Proceedings of SPIE

SPIE conference papers are published in the Proceedings of SPIE and available via the SPIE Digital Library, the world’s largest collection of optics and photonics research.  

The Proceedings are indexed in Web of Science, Scopus, Ei Compendex, Inspec, Google Scholar, Astrophysical Data System (ADS), DeepDyve, ReadCube, CrossRef, and other scholarly indexes, and are widely accessible to leading research organizations, conference attendees, and individual researchers. 

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