• Optical Metrology
    Conferences
Internationales Congress Center
Munich, Germany
25 - 29 June 2017
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SPIE Optical Metrology returns in 2019

Mark your calendar for SPIE Optical Metrology 2019

SPIE Optical Metrology, the premier European conference to meet with scientists, engineers, researchers, and product developers to discuss the latest research in measurement systems, modeling, videometrics, and inspection. 

Mark your calendar for the 2019 event.

Important dates

2019 Call for Papers
Opens August 2018

2019 Event
24-27 June 2019

See what happened at the 2017 event

2017 Conference topics

 • Optical Measurement Systems for Industrial Inspection
 • Modeling Aspects in Optical Metrology
 • O3A: Optics for Arts, Architecture, and Archaeology
 • Videometrics, Range Imaging, and Applications
 • Optical Methods for Inspection, Characterization, and Imaging of Biomaterials
 • Automated Visual Inspection and Machine Vision

SPIE Optical Metrology is part of

Proceedings of SPIE

SPIE conference papers are published in the Proceedings of SPIE and available via the SPIE Digital Library, the world’s largest collection of optics and photonics research.  

The Proceedings are indexed in Web of Science, Scopus, Ei Compendex, Inspec, Google Scholar, Astrophysical Data System (ADS), DeepDyve, ReadCube, CrossRef, and other scholarly indexes, and are widely accessible to leading research organizations, conference attendees, and individual researchers. 

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