• Optical Metrology
Internationales Congress Center
Munich, Germany
26 - 29 June 2017
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SPIE Optical Metrology returns in 2017

Munich, Germany

SPIE Optical Metrology, the premier European conference to meet with scientists, engineers, researchers, and product developers to discuss the latest research in measurement systems, modeling, videometrics, and inspection.

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2017 Conference Topics:
 • Optical Measurement Systems for Industrial Inspection
 • Modeling Aspects in Optical Metrology
 • O3A: Optics for Arts, Architecture, and Archaeology
 • Videometrics, Range Imaging, and Applications
 • Optical Methods for Inspection, Characterization, and Imaging of Biomaterials
 • Automated Visual Inspection and Machine Vision
 • Digital Optical Technologies
Review the 2015 Programme
 • Onsite news and photos
 • Final Technical Programme (2 MB PDF)
 • Technical Abstracts (1 MB PDF)

BBC News - Science & Environment: 20 January 2015
X-ray technique reads burnt Vesuvius scroll
For the first time, words have been read from a burnt, rolled-up scroll buried by Mount Vesuvius in AD79.

SPIE Optical Metrology is part of:


SPIE conference papers are published in the Proceedings of SPIE and available via the SPIE Digital Library, the world’s largest collection of optics and photonics research.  

The Proceedings are indexed in Web of Science, Scopus, Ei Compendex, Inspec, Google Scholar, Astrophysical Data System (ADS), DeepDyve, ReadCube, CrossRef, and other scholarly indexes, and are widely accessible to leading research organizations, conference attendees, and individual researchers. 


Cooperating Organisations

 European Optical Society

Important Dates

Abstracts Due
19 December 2016

Author Notification
18 Feburary 2017

On-site Manuscripts Due
15 April 2017

Post-meeting Manuscripts Due
(O3A Conference only)
27 May 2017


Browse Defense, Security, and Sensing 2011 papers


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