Prof. Donghyun Kim

Fellow Member | Professor at Yonsei Univ
Kim, Donghyun
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SPIE Membership: 20.2 years
SPIE Awards: Fellow status | Senior status
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Area of Expertise: Plasmonics, Microscopy, Biosensors, Molecular imaging
Websites: Company Website
Social Media: LinkedIn
ORCID iD: https://orcid.org/0000-0003-1960-0527
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Profile Summary

Donghyun Kim received B.S. and M.S. from Seoul National University in Department of Electronics Engineering. He graduated from Massachusetts Institute of Technology with Ph.D. in the area of multi-dimensional display technologies and smart optical filters. He worked on next generation fiber-optic access communication systems at Photonic Research and Test Center of Corning Inc. as a senior research scientist and then investigated cellular biophotonic sensors for cell-based assays at Cornell University as a postdoctoral fellow. He has since been leading Biophotonics Engineering Laboratory of Yonsei University, Seoul, Korea. He was elected as fellow of SPIE in 2021. The main theme of his research at Yonsei has been focused on photonic technology and applications in biomedical engineering based on near-field manipulation by plasmonic techniques and metastructures.

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