Prof. Donghyun Kim

Fellow Member | Professor at Yonsei Univ
Kim, Donghyun
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SPIE Membership: 16.4 years total | 16.4 years voting
SPIE Awards: Fellow status | Senior status
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Area of Expertise: Plasmonics, Microscopy, Biosensors, Molecular imaging
Websites: Company Website
Social Media: LinkedIn
ORCID iD: https://orcid.org/0000-0003-1960-0527
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Profile Summary

Donghyun Kim received B.S. and M.S. from Seoul National University in 1993 and 1995 in Department of Electronics Engineering. He graduated from the Massachusetts Institute of Technology in 2001 with Ph.D. in Department of Electrical Engineering in the area of novel multi-dimensional display technologies and smart optical filters. He worked on next generation fiber-optic access communication systems at Photonic Research and Test Center of Corning Inc. as a senior research scientist and then investigated cellular biophotonic sensors for cell-based assays at Cornell University as a postdoctoral fellow. He has since been leading Biophotonics Engineering Laboratory of Yonsei University, Seoul, Korea. He was elected as fellow of SPIE in 2021. The main theme of his research at Yonsei has been focused on photonic technology and applications in biomedical engineering based on plasmonic techniques.

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