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Proceedings Paper

Exciton-polariton coupling and enhanced emission in SiC nanocrystals
Author(s): Georgiy Polupan; Miguel Morales-Rodriguez
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Paper Abstract

The paper presents the results of 6H-SiC nanocrystals (NCs) characterization using atomic force microscope (AFM), scanning electron microscopy (SEM), X-ray diffraction (XRD) and photoluminescence spectroscopy techniques. XRD study shows the investigated porous 6H-SiC layers contain inclusions of 4H-SiC and 15R-SiC polytypes. Photoluminescence study of porous SiC layers with different thicknesses and SiC NC sizes (50-250 nm) reveals the intensity stimulation of exciton related PL bands in different SiC polytypes. The intensity enhancement for exciton-related PL bands is attributed to the exciton recombination rate increasing due to the realization of exciton-polariton effects in big size SiC NCs of different polytypes (6H-PSiC with inclusions of 15R- and 4H-PSiC).

Paper Details

Date Published: 23 September 2011
PDF: 6 pages
Proc. SPIE 8102, Nanoengineering: Fabrication, Properties, Optics, and Devices VIII, 81020T (23 September 2011); doi: 10.1117/12.893926
Show Author Affiliations
Georgiy Polupan, ESIME, National Polytechnic Institute (Mexico)
Miguel Morales-Rodriguez, PCIM, Univ. Autónoma Metropolitana (Mexico)


Published in SPIE Proceedings Vol. 8102:
Nanoengineering: Fabrication, Properties, Optics, and Devices VIII
Elizabeth A. Dobisz; Louay A. Eldada, Editor(s)

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