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Proceedings Paper

EXX phenomena in macroscopic, microscopic, and nanoscopic structures
Author(s): S. A. Solin
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Paper Abstract

The new "EXX" phenomena in macroscopic, microscopic and nanoscopic metal-semiconductor hybrid structures is described. Here E = extraordinary and XX = magnetoresistance (EMR), piezoconductance (EPC), optoconductance (EOC), and electroconductance (EEC). This new class of phenomena is based on the control and dominance of the geometric contributions, e.g. sample shape, lead placement, the presence of inhomogenieties, etc., to the transport properties of a physical system in contrast to traditional transport phenomena which are dominated by the intrinsic properties, e.g. mobility, carrier density, band structure, etc. The underlying phyiscs of EXX phenomena is elucidated with particular emphasis on the use of analytic and finite element analysis methods to quantitatively account for the observed EXX signal enhancement. The potential application of EXX phenomena to the study of the biologically relevant properties of cells such as surface charge density will be described.

Paper Details

Date Published: 5 May 2010
PDF: 17 pages
Proc. SPIE 7679, Micro- and Nanotechnology Sensors, Systems, and Applications II, 76790B (5 May 2010); doi: 10.1117/12.849887
Show Author Affiliations
S. A. Solin, Washington Univ. in St. Louis (United States)

Published in SPIE Proceedings Vol. 7679:
Micro- and Nanotechnology Sensors, Systems, and Applications II
Thomas George; M. Saif Islam; Achyut Kumar Dutta, Editor(s)

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