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Proceedings Paper

Stray light rejection techniques for LED measurements using CCD based spectrometers
Author(s): Joe Jablonski; Angelo Arecchi; Justin Jacobs; Topher Annicchiarco
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Paper Abstract

CCD based spectrometers are commonly used to characterize the optical performance of LEDs. All CCD based spectrometers exhibit varying amounts of stray light. This situation is exacerbated by using tungsten-halogen based sources for calibration. NIST has come up with methods to characterize the stray light associated with CCD based spectrometers using multiple lasers spanning the visible and near IR spectrum. At Sphereoptics we have developed methods to map out and correct for stray light using a double monochromator and software. We have been able to mathematically remove the effects of stray light on many common LED characterization measurements such as spectral flux for instance. These effects were found to be quite substantial especially in the UV part of the spectrum. In this paper we will present our findings on the nature of stray light found in a B&W BRC112E UV spectrometer as well as our progress in correcting the errors it causes.

Paper Details

Date Published: 3 February 2009
PDF: 6 pages
Proc. SPIE 7231, Light-Emitting Diodes: Materials, Devices, and Applications for Solid State Lighting XIII, 72311E (3 February 2009); doi: 10.1117/12.809241
Show Author Affiliations
Joe Jablonski, SphereOptics, LLC (United States)
Angelo Arecchi, SphereOptics, LLC (United States)
Justin Jacobs, SphereOptics, LLC (United States)
Topher Annicchiarco, SphereOptics, LLC (United States)

Published in SPIE Proceedings Vol. 7231:
Light-Emitting Diodes: Materials, Devices, and Applications for Solid State Lighting XIII
Klaus P. Streubel; Heonsu Jeon; Li-Wei Tu, Editor(s)

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