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Proceedings Paper

Fringe analysis today and tomorrow
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Paper Abstract

This paper provides an overview of the current state-of-the-art in fringe pattern analysis, with a particular emphasis on recent developments in digital speckle pattern interferometry (DSPI) and digital speckle photography (DSP). The main topics covered are as follows: spiral transform for analysis of fringe patterns without spatial carriers, real-time analysis, dynamic DSPI, three-dimensional phase unwrapping, combined DSPI/DSP techniques, and three-dimensional DSP. Several interesting applications outside mainstream speckle metrology are also described, including fingerprint analysis, and measurement of both strain and magnetic fields within the human brain using phase contrast magnetic resonance imaging (MRI).

Paper Details

Date Published: 27 May 2003
PDF: 8 pages
Proc. SPIE 4933, Speckle Metrology 2003, (27 May 2003); doi: 10.1117/12.516628
Show Author Affiliations
Jonathan Mark Huntley, Loughborough Univ. (United Kingdom)

Published in SPIE Proceedings Vol. 4933:
Speckle Metrology 2003
Kay Gastinger; Ole Johan Lokberg; Svein Winther, Editor(s)

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