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Proceedings Paper

Refractive index measurements of planar chalcogenide waveguide
Author(s): Jacques M Laniel; Jean-Michel Menard; Alain Villeneuve; Real Vallee; Cedric Lopez; Kathleen A. Richardson
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Paper Abstract

We report results from a systematic study of the linear refractive index of thin films made of As-S-Se glasses which are part of the chalcogenide family. We have studied eight different compositions. The refractive index are measured by the mean of a grating coupling experiment. The measurements are performed around 1.5μm for both annealed and non-annealed glasses. We observe that annealing the samples increases their refractive index. We also note that the increase of Selenium concentration increases the refractive index and the decrease of Arsenic concentration decreases the refractive index.

Paper Details

Date Published: 17 February 2003
PDF: 7 pages
Proc. SPIE 4833, Applications of Photonic Technology 5, (17 February 2003); doi: 10.1117/12.474311
Show Author Affiliations
Jacques M Laniel, Univ. Laval (Canada)
Jean-Michel Menard, Univ. Laval (Canada)
Alain Villeneuve, ITF Optical Technologies (Canada)
Real Vallee, Univ. Laval (Canada)
Cedric Lopez, Univ. of Central Florida (United States)
Kathleen A. Richardson, Univ. of Central Florida (United States)

Published in SPIE Proceedings Vol. 4833:
Applications of Photonic Technology 5
Roger A. Lessard; George A. Lampropoulos; Gregory W. Schinn, Editor(s)

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