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Proceedings Paper

Au-doped HgCdTe for infrared detectors and focal plane arrays
Author(s): Muren Chu; Sevag Terterian; C. C. Wang; Shoghig Mesropian; H. K. Gurgenian; Dee-Son Pan
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Paper Abstract

Recently, it was reported that p-type, Au-doped HgCdTe epilayers have a carrier lifetime two to three times higher than the Hg-vacancy doped epilayers with the same condition type. Analysis of the temperature dependent Hall measurement results indicates the existence of vacancy complexes in the vacancy doped HgCdTe epilayers but not in the Au-doped epilayers. Therefore, it is very likely that the defect complexes are generation-recombination centers, which reduce the carrier lifetime. Shortwave, midwave, and longwave HgCdTe diodes arrays have been produced in the Au-doped HgCdTe epilayers by the ion implantation technique. The n- type conversion by implantation is explained by the formation of tellurium antisites. Excellent array performances have been observed. Comparing these arrays to the heterojunction HgCdTe arrays, the arrays formed by ion implantation perform similar to or even better than the heterojunction array at liquid nitrogen temperature, but are inferior to the heterojunction arrays at a temperature over 150K.

Paper Details

Date Published: 12 November 2001
PDF: 7 pages
Proc. SPIE 4454, Materials for Infrared Detectors, (12 November 2001);
Show Author Affiliations
Muren Chu, Fermionics Corp. (United States)
Sevag Terterian, Fermionics Corp. (United States)
C. C. Wang, Fermionics Corp. (United States)
Shoghig Mesropian, Fermionics Corp. (United States)
H. K. Gurgenian, Fermionics Corp. (United States)
Dee-Son Pan, Univ. of California/Los Angeles (United States)

Published in SPIE Proceedings Vol. 4454:
Materials for Infrared Detectors
Randolph E. Longshore, Editor(s)

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