Proceedings Paper
THz imaging in a Brewster-angle configuration: characterization of thin oxide coatings for fuel cell applications| Format | Member Price | Non-Member Price |
|---|---|---|
| $17.00 | $21.00 |
Paper Abstract
Time-resolved THz imaging for the incidence-angle dependent 3D tomographic characterization of layered structures is presented. We illustrate the capabilities of the developed system on multi-layer ceramic samples used for solid oxide fuel cells. Diverse methods for determining unknown refractive indices are discussed. The significant influence of the angle of incidence of a THz imaging system on the measured signal is demonstrated, which can be exploited especially in Brewster-angle configurations to enhance the capabilities of any THz tomography system.
Paper Details
Date Published: 9 September 1999
PDF: 7 pages
Proc. SPIE 3828, Terahertz Spectroscopy and Applications II, (9 September 1999); doi: 10.1117/12.361053
Published in SPIE Proceedings Vol. 3828:
Terahertz Spectroscopy and Applications II
J. Martyn Chamberlain, Editor(s)
PDF: 7 pages
Proc. SPIE 3828, Terahertz Spectroscopy and Applications II, (9 September 1999); doi: 10.1117/12.361053
Show Author Affiliations
M. Brucherseifer, Rheinisch-Westfaelische Technische Hochschule Aachen (Germany)
Peter Haring Bolivar, Rheinisch-Westfaelische Technische Hochschule Aachen (Germany)
Peter Haring Bolivar, Rheinisch-Westfaelische Technische Hochschule Aachen (Germany)
Hans Hermann Klingenberg, DLR (Germany)
Heinrich Kurz, Rheinisch-Westfaelische Technische Hochschule Aachen (Germany)
Heinrich Kurz, Rheinisch-Westfaelische Technische Hochschule Aachen (Germany)
Published in SPIE Proceedings Vol. 3828:
Terahertz Spectroscopy and Applications II
J. Martyn Chamberlain, Editor(s)
© SPIE. Terms of Use
