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Proceedings Paper

THz imaging in a Brewster-angle configuration: characterization of thin oxide coatings for fuel cell applications
Author(s): M. Brucherseifer; Peter Haring Bolivar; Hans Hermann Klingenberg; Heinrich Kurz
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Paper Abstract

Time-resolved THz imaging for the incidence-angle dependent 3D tomographic characterization of layered structures is presented. We illustrate the capabilities of the developed system on multi-layer ceramic samples used for solid oxide fuel cells. Diverse methods for determining unknown refractive indices are discussed. The significant influence of the angle of incidence of a THz imaging system on the measured signal is demonstrated, which can be exploited especially in Brewster-angle configurations to enhance the capabilities of any THz tomography system.

Paper Details

Date Published: 9 September 1999
PDF: 7 pages
Proc. SPIE 3828, Terahertz Spectroscopy and Applications II, (9 September 1999); doi: 10.1117/12.361053
Show Author Affiliations
M. Brucherseifer, Rheinisch-Westfaelische Technische Hochschule Aachen (Germany)
Peter Haring Bolivar, Rheinisch-Westfaelische Technische Hochschule Aachen (Germany)
Hans Hermann Klingenberg, DLR (Germany)
Heinrich Kurz, Rheinisch-Westfaelische Technische Hochschule Aachen (Germany)

Published in SPIE Proceedings Vol. 3828:
Terahertz Spectroscopy and Applications II
J. Martyn Chamberlain, Editor(s)

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