Proceedings Paper
Measurement of dispersive properties of optical materials and mirrors using spectrally resolved white-light interferometry| Format | Member Price | Non-Member Price |
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Paper Abstract
We present a simple, accurate and inexpensive interferometric technique based on the spectrally resolved white-light interferometry to determine the group-delay dispersion of optical elements, such as laser crystals and multilayer mirrors. Due to the different dispersion properties of these elements, different evaluation methods of the interference fringes are used for the mirrors and crystals. The reproducibility of our measurements is +/- 5 fs2 and +/- 3% for mirrors and crystals, respectively, with high spectral resolution over a broad spectra range (700 - 900 nm). These dispersion data are important for the construction of compact femtosecond solid-state lasers.
Paper Details
Date Published: 20 April 1998
PDF: 6 pages
Proc. SPIE 3359, Optical Diagnostics of Materials and Devices for Opto-, Micro-, and Quantum Electronics 1997, (20 April 1998); doi: 10.1117/12.306204
Published in SPIE Proceedings Vol. 3359:
Optical Diagnostics of Materials and Devices for Opto-, Micro-, and Quantum Electronics 1997
Sergey V. Svechnikov; Mikhail Ya. Valakh, Editor(s)
PDF: 6 pages
Proc. SPIE 3359, Optical Diagnostics of Materials and Devices for Opto-, Micro-, and Quantum Electronics 1997, (20 April 1998); doi: 10.1117/12.306204
Show Author Affiliations
Zsolt Bor, Jozsef Attila Univ. (Hungary)
Attila P. Kovacs, Jozsef Attila Univ. (Hungary)
Attila P. Kovacs, Jozsef Attila Univ. (Hungary)
Karoly Osvay, Jozsef Attila Univ. (Hungary)
Robert Szipocs, Research Institute for Solid State Physics (Hungary)
Robert Szipocs, Research Institute for Solid State Physics (Hungary)
Published in SPIE Proceedings Vol. 3359:
Optical Diagnostics of Materials and Devices for Opto-, Micro-, and Quantum Electronics 1997
Sergey V. Svechnikov; Mikhail Ya. Valakh, Editor(s)
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