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Proceedings Paper

Standards for oscillatory scanners
Author(s): Alan P. Ludwiszewski
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Paper Abstract

Optical scanner specifications are subject to a wealth of nonstandardization and scanner terminology to considerable misuse. The need for a standardization of terms and definitions is readily apparent to anyone involved in specifying or furnishing this technology. There is considerable debate as to the correct method of test or to the appropriate terminology for a given phenomenon. This paper proposes standard definitions and highlights test methods that appear either most common in industry or most correct. This is an attempt to stimulate discussion on standardization of terms and tests, the first step to a definitive standard. A glossary of terms is provided with brief definitions and justification, where required. Several of these terms, which require more extensive treatment to fully understand their intricacies and significance, are reviewed in a discussion section that follows. The included examination of test methods brings out subtleties in parameter definitions and the clear need for, as well as the difficulty in, standardization.

Paper Details

Date Published: 1 February 1991
PDF: 12 pages
Proc. SPIE 1454, Beam Deflection and Scanning Technologies, (1 February 1991); doi: 10.1117/12.28028
Show Author Affiliations
Alan P. Ludwiszewski, General Scanning, Inc. (United States)

Published in SPIE Proceedings Vol. 1454:
Beam Deflection and Scanning Technologies
Leo Beiser; Gerald F. Marshall, Editor(s)

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