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Proceedings Paper

Characterization of a silicon photomultiplier for the Ultra-Fast Astronomy telescope
Author(s): Siyang Li; George F. Smoot III
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Paper Abstract

In this study, we characterized the S13360-3050CS Multi-Pixel Photon Counter (MPPC), a silicon photomultiplier (SiPM) manufactured by Hamamatsu Photonics K.K.. Measurements were obtained inside a light tight dark box using 365 nm, 400 nm, 525 nm, 660 nm, 720 nm, 810 nm, and 900 nm light-emitting diodes (LED) and the Citiroc 1A front-end evaluation system manufactured by Weeroc. At a 2.95V over voltage, we measured a dark count rate of 5.07×105 counts per second at 26°C, crosstalk probability of 8.7%, photon detection efficiency of 36% at 400 nm, linear range of 1.8×107 photons per second, and saturation at 5×108 photons per second. The S13360- 3050CS MPPC is a candidate detector for the Ultra-Fast Astronomy (UFA) telescope which will characterize the optical sky in the millisecond to nanosecond timescales using two SiPM arrays operated in coincidence mounted on the 0.7 meter Nazarbayev University Transient Telescope at the Assy-Turgen Astrophysical Observatory (NUTTelA-TAO) located near Almaty, Kazakhstan. One objective of the UFA telescope will be to search for optical counterparts to fast radio bursts (FRB) that can be used to identify the origins of FRB and probe the epoch of reionization and baryonic matter in the interstellar and intergalactic mediums.

Paper Details

Date Published: 9 September 2019
PDF: 9 pages
Proc. SPIE 11115, UV/Optical/IR Space Telescopes and Instruments: Innovative Technologies and Concepts IX, 111150A (9 September 2019); doi: 10.1117/12.2528990
Show Author Affiliations
Siyang Li, Univ. of California, Berkeley (United States)
George F. Smoot III, Univ. of California, Berkeley (United States)
Hong Kong Univ. of Science and Technology (Hong Kong, China)
Nazarbayev Univ. (Kazakhstan)

Published in SPIE Proceedings Vol. 11115:
UV/Optical/IR Space Telescopes and Instruments: Innovative Technologies and Concepts IX
Allison A. Barto; James B. Breckinridge; H. Philip Stahl, Editor(s)

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