Share Email Print

Proceedings Paper

Error correction model based on echo light intensity in pulse laser ranging system
Author(s): Fan Wang; Weixian Qian; Ye Qian; Wenguang Yang
Format Member Price Non-Member Price
PDF $17.00 $21.00

Paper Abstract

In the pulse laser ranging system based on time-of-flight measurement, since different targets have different reflection characteristics, the echo light intensity will affect the leading edge moment received by the range finder, which results in the deviation of the ranging result. In order to address this problem, this paper proposes a leading edge time correction model based on pulse width. The pulse width of the echo is positively correlated with the light intensity, so the pulse intensity can be used to characterize the light intensity and correct the leading edge time. According to Marius law, the leading edge moment acquisition experiments are carried out under different echo intensities produced by polarization state generator (PSG). It has been demonstrated that the presented model is consistent with experimental data. From the analysis and discussion, it is shown that the correction model can effectively correct the error caused by the echo light intensity of the pulsed laser ranging system, thus improving the accuracy of ranging.

Paper Details

Date Published: 9 September 2019
PDF: 7 pages
Proc. SPIE 11129, Infrared Sensors, Devices, and Applications IX, 111290U (9 September 2019); doi: 10.1117/12.2526526
Show Author Affiliations
Fan Wang, Nanjing Univ. of Science and Technology (China)
Weixian Qian, Nanjing Univ. of Science and Technology (China)
Ye Qian, Nanjing Univ. of Science and Technology (China)
Wenguang Yang, Nanjing Univ. of Science and Technology (China)

Published in SPIE Proceedings Vol. 11129:
Infrared Sensors, Devices, and Applications IX
Paul D. LeVan; Priyalal Wijewarnasuriya; Ashok K. Sood, Editor(s)

© SPIE. Terms of Use
Back to Top
Sign in to read the full article
Create a free SPIE account to get access to
premium articles and original research
Forgot your username?