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Proceedings Paper

Strain transfer characteristics of resistance strain-type transducer
Author(s): Zhigang Wang; Chi Xiao; Yinming Zhao; Yongqian Li; Zili Zhou
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Paper Abstract

The strain transfer characteristics of resistance strain-type transducer were theoretically investigated. A resistance straintype transducer was modeled to be a four-layer and two-glue (FLTG) structure model, which comprises successively an elastomer, a ground adhesive, a substrate layer, an upper adhesive, a sensitive grids layer, and a polymer cover. The strain transfer progress in a resistance strain-type transducer was described by the FLTG structure model. The strain transitional zone (STZ) was defined and the strain transfer ratio (STR) of the FLTG structure was formulated. The dependence of the STR and STZ on both the structural sizes and material parameters were calculated. The results indicate that the ground adhesive (including its thickness, and shear modulus) have a greater influence on the strain transitional zone ratio and strain transitional zone. In order to ensure a higher sensitivity of the resistance strain-type transducer, the ground adhesive layer should be as thin as possible, while its shear modulus should be as large as possible. Selecting a ground adhesive with a large elasticity modulus can effectively reduce the influence of the thickness of the ground adhesive on the strain transfer ratio.

Paper Details

Date Published: 7 March 2019
PDF: 6 pages
Proc. SPIE 11053, Tenth International Symposium on Precision Engineering Measurements and Instrumentation, 110532N (7 March 2019); doi: 10.1117/12.2511954
Show Author Affiliations
Zhigang Wang, Northwestern Polytechnical Univ. (China)
Chi Xiao, Northwestern Polytechnical Univ. (China)
Yinming Zhao, Beijing Changcheng Institute of Metrology & Measurement (China)
Yongqian Li, Northwestern Polytechnical Univ. (China)
Zili Zhou, Chinese Aeronautical Establishment (China)

Published in SPIE Proceedings Vol. 11053:
Tenth International Symposium on Precision Engineering Measurements and Instrumentation
Jiubin Tan; Jie Lin, Editor(s)

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