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Proceedings Paper

Research on volume metrology method of large vertical energy storage tank based on internal electro-optical distance-ranging method
Author(s): Huadong Hao; Haolei Shi; Pengju Yi; Ying Liu; Cunjun Li; Shuguang Li
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Paper Abstract

A Volume Metrology method based on Internal Electro-optical Distance-ranging method is established for large vertical energy storage tank. After analyzing the vertical tank volume calculation mathematical model, the key processing algorithms, such as gross error elimination, filtering, streamline, and radius calculation are studied for the point cloud data. The corresponding volume values are automatically calculated in the different liquids by calculating the cross-sectional area along the horizontal direction and integrating from vertical direction. To design the comparison system, a vertical tank which the nominal capacity is 20,000 m3 is selected as the research object, and there are shown that the method has good repeatability and reproducibility. Through using the conventional capacity measurement method as reference, the relative deviation of calculated volume is less than 0.1%, meeting the measurement requirements. And the feasibility and effectiveness are demonstrated.

Paper Details

Date Published: 12 January 2018
PDF: 6 pages
Proc. SPIE 10621, 2017 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems, 106211V (12 January 2018); doi: 10.1117/12.2295485
Show Author Affiliations
Huadong Hao, Zhoushan Institute of Calibration and Testing (China)
Haolei Shi, Zhoushan Institute of Calibration and Testing (China)
Pengju Yi, Henan College of Surveying and Mapping (China)
Ying Liu, Zhoushan Institute of Calibration and Testing (China)
Cunjun Li, Zhoushan Institute of Calibration and Testing (China)
Shuguang Li, Zhoushan Institute of Calibration and Testing (China)


Published in SPIE Proceedings Vol. 10621:
2017 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems
Jigui Zhu; Hwa-Yaw Tam; Kexin Xu; Hai Xiao; Liquan Dong, Editor(s)

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