• Optifab 2015
    Job Fair
    Special Events
    Travel to Rochester
    Onsite Services
    Registration Pricing + Details
    For Authors/Presenters
    For Chairs/Committees
    For Exhibitors
Joseph A. Floreano Rochester Convention Center
Rochester, NY , United States
12 - 15 October 2015
Search Program:  go
Print PageEmail Page

Rochester is the nation’s newest manufacturing innovation hub. And the home to SPIE Optifab

Optifab 2015, in Rochester N.Y., Call for Papers

Register today for SPIE Optifab the largest optical manufacturing conference and exhibition held in North America. Organized jointly by SPIE and APOMA, this event has a unique technical focus on classical and advanced optical manufacturing technologies. Come see and learn about optical fabrication, testing, and more.

IN THE NEWS: NY wins $600M for research, development in photonics

Download Advance Program PDF Advance Program (1MB PDF)
Register for SPIE Optifab View registration pricing and details
View Hotel Information View hotel information
2015 Exhibition
Exhibitor List
Exhibition Floor Plan
2015 Technical Conference
Technical papers
Optical manufacturing
Design for manufacturing
Materials and optical materials sciences
Classical and automated fabrication
Grinding, polishing, and new methods of surface finishing
Injection/glass molding, lithographic processing, and chemical etching
Process science
New developments in coatings technology
New developments in metrology
Opto-mechanical design and fabrication
Interactivity and data interfaces between optical design programs, mechanical design programs, fabrication equipment, and metrology instrumentation
Fabrication of freeform surfaces
Commercial papers
Developments in optical materials
New infrared materials
Advanced optical fabrication equipment
Coating equipment
Metrology equipment
Faculty & Students - Call for Posters has been extended
Optifab is still accepting late Student Posters. Please email Robbine at robbineh@spie.org
APOMA Travel Grants and Outstanding Student Poster Learn More 
See full conference details
A look back at 2013
2013 Final Technical Program (PDF 1.6 MB)
2013 Technical Abstract (PDF 368 kB)
2013 Exhibit Guide (PDF 12.6 MB)
2013 Event News and Photos

Join SPIE in celebration of:


SPIE logo


Important Dates

Author Notification
12 June 2015

Manuscripts Due
31 August 2015

Registration Discount Until
25 September 2015

Get the SPIE App Now
Download your free Conference and Exhibition App (iPhone and Android) Download the free Conference and Exhibition App for iOS or Android.


Sign up for event e-alerts