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    Plan to Attend

    On behalf of SPIE, Scanning Microscopies, and the Organizing Committee, we are pleased to announce the second annual SPIE Scanning Microscopies symposium to be held in Monterey, California. Previous SPIE Scanning Microscopies conferences were held in Baltimore, MD in conjunction with the SPIE DSS Symposium. The annual SPIE Scanning Microscopies continues to be the premier worldwide technical meeting devoted exclusively to scanning microscopies. All researchers using any form of scanning microscopy are encouraged to participate. Scanning Microscopies has also hosted a growing forensics microscopy following, and as such, the applications of the scanning microscopies to the forensics sciences are also emphasized.

    The Scanning Microscopies 2015 meeting brings microscopists from all aspects of scanning microscopies (from scanned optics and probes to scanned particle beams) together in a single forum to discuss current research and new advancements in the field. Previous Scanning meetings have had a large Forensics and Food Technology following. The various scanned microscopies are also key investigative and research tools in micro and nanotechnology.

    We invite you to attend Scanning Microscopies, and look forward to seeing you in Monterey!

    Mike Postek

    Michael T. Postek
    National Institute of Standards and Technology
    2015 Symposium Chair

     

    Dale Newbury

    Dale E. Newbury
    National Institute of Standards and Technology
    2015 Symposium Chair

     

    S. Frank Platek

    S. Frank Platek
    U.S. Food and Drug Administration
    2015 Symposium Chair

     

    Tim K. Maugel
    Univ. of Maryland, College Park
    2015 Symposium Chair