XPS with complementary multi-technique analysis of carbon materials
In person: 28 September 2021 • 4:30 PM - 4:50 PM BST | Carron 1
Understanding the surface chemistry of carbonaceous materials is of importance in a range of fields, especially with the somewhat exponential increase in the study of graphene and related materials. Such carbon materials can vary in elemental content, surface chemistry and nanostructure which will all influence the observed XPS spectrum. Whilst there have been many methods to elucidate chemical states, including SP2-SP3 ratios using XPS, they have all been reported with varying success. Here in we present a coincident multi-technique analysis of carbon materials and discuss the merits of such coincident analysis
Cardiff Univ. (United Kingdom)
After completing his PhD in surface science and postdoctoral fellowship at Cardiff University, David took over the role of Surface Analysis Manager at the university, supporting both academia and industry and is also the Technical Manager for HarwellXPS, the EPSRC National Facility for X-Ray Photoelectron Spectroscopy. He has over 20 years of experience in surface characterization at both using laboratory and synchrotron techniques. He has authored/co-authored over 220 papers including publications in Science and Nature.