Recent advances in near-ambient-pressure XPS for nonconventional samples and operando experiments
In person: 29 September 2021 • 4:50 PM - 5:10 PM BST | Carron 1
Near-Ambient-Pressure XPS (NAP-XPS) is a technique in which XPS can be performed in a non-vaccum environment. Lifting the restraint of vacuum compatibility not only allows to analyze samples which are not vacuum compatible (such as liquids, gasses or strongly outgassing samples), it can also drastically decrease sample introduction time and offers a new mechanism for charge compensation by gas ionization. The NAP-XPS community has been steadily growing, fueled by a constant development of technology on the photon source and spectrometer side. The progress in experimental techniques is especially driven by fields such as catalysis, electrochemistry and hydrogen technology. These research fields benefit especially from the capability of NAP-XPS to analyze samples and devices under operation-like conditions, by measuring solid|liquid or solid|gas interfaces, by applying high temperatures or voltages, and by being able to control experimental boundaries in real time.
SPECS GmbH (Germany)
Dr. Mirko Weidner is a Materials Scientist who has specialized in the field of surface analytics and XPS in particular. His special interest and topic of his PhD thesis is research in transparent conductive oxides, especially SnO2, and using XPS to determine the Fermi Level position in order to understand mechanisms that limit the electrical conductivity in such materials. Since joining SPECS Surface Analysis GmbH as a regional sales manager in 2016, he has spent a lot of time in the Pacific region, in particular Japan, Korea and Taiwan. Recently, he has taken on the role of Application Expert for all products related to XPS and NAP-XPS at SPECS.