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New Titles Update
New Conference Proceedings - 9 December 2010 (Sale prices apply during December) | Aerospace, Defense, Remote Sensing, and Astronomy |
Earth Resources and Environmental Remote Sensing/GIS Applications
Editors: Ulrich Michel, Univ. of Education Heidelberg (Germany); Daniel L. Civco, Univ. of Connecticut (United States)
Vol. 7831 · 486 pages; 51 papers
ISBN: 9780819483485
SPIE Members $100 Sale $80; Nonmembers $130 Sale $104
Lidar Technologies, Techniques, and Measurements for Atmospheric Remote Sensing VI
Editors: Upendra N. Singh, NASA Langley Research Ctr. (United States); Gelsomina Pappalardo, Consiglio Nazionale delle Ricerche (Italy)
Vol. 7832 · 256 pages; 26 papers
ISBN: 9780819483492
SPIE Members $60 Sale $48; Nonmembers $80 Sale $62
Electro-Optical Remote Sensing, Photonic Technologies, and Applications IV
Editors: Gary W. Kamerman, FastMetrix, Inc. (United States); Ove Steinvall, Swedish Defence Research Agency (Sweden); Keith L. Lewis, Sciovis Ltd. (United Kingdom); Richard C. Hollins, Defence Science and Technology Lab. (United Kingdom); Thomas J. Merlet, Thales Air Systems S.A. (France); Gary J. Bishop, BAE Systems (United Kingdom); John D. Gonglewski, Air Force Research Lab. (United States)
Vol. 7835 · 322 pages; 29 papers
ISBN: 9780819483539
SPIE Members $60 Sale $48; Nonmembers $80 Sale $62
Sixth International Symposium on Digital Earth: Models, Algorithms, and Virtual Reality
Editors: Huadong Guo, Ctr. for Earth Observation and Digital Earth (China); Changlin Wang, Institute of Remote Sensing Applications (China)
Vol. 7840 · 644 pages; 76 papers
ISBN: 9780819483638
SPIE Members $100 Sale $80; Nonmembers $130 Sale $104
Sixth International Symposium on Digital Earth: Data Processing and Applications
Editors: Huadong Guo, Ctr. for Earth Observation and Digital Earth (China); Changlin Wang, Institute of Remote Sensing Applications (China)
Vol. 7841 · 600 pages; 71 papers
ISBN: 9780819483645
SPIE Members $90 Sale $72; Nonmembers $120 Sale $96
Lidar Remote Sensing for Environmental Monitoring XI
Editors: Upendra N. Singh, NASA Langley Research Ctr. (United States); Kohei Mizutani, National Institute of Information and Communications Technology (Japan)
Vol. 7860 · 118 pages; 15 papers
ISBN: 9780819483904
SPIE Members $53 Sale $42; Nonmembers $70 Sale $56
Proceedings of SPIE on CD-ROM
Security and Defence 2010
Vol. CDS412 · 167 papers
ISBN: 9780819483577
SPIE Members $270 Sale $216; Nonmembers $355 Sale $284
Optics in Health Care and Biomedical Optics IV
Editors: Qingming Luo, Britton Chance Ctr. for Biomedical Photonics (China); Ying Gu, Chinese PLA General Hospital (China); Xingde Li, The Johns Hopkins Univ. (United States)
Vol. 7845 · 580 pages; 75 papers
ISBN: 9780819483751
SPIE Members $130 Sale $104; Nonmembers $170 Sale $136
| Electronic Imaging, Displays, and Medical Imaging |
LED and Display Technologies
Editors: Gang Yu, Cbrite Inc. (United States); Yanbing Hou, Beijing Jiaotong Univ. (China)
Vol. 7852 · 272 pages; 34 papers
ISBN: 9780819483829
SPIE Members $80 Sale $64; Nonmembers $105 Sale $84
Semiconductor Lasers and Applications IV
Editors: Ning-Hua Zhu, Institute of Semiconductors (China); Jinmin Li, Institute of Semiconductors (China); Farzin Amzajerdian, NASA Langley Research Ctr. (United States); Hiroyuki Suzuki, NTT Photonics Labs. (Japan)
Vol. 7844 · 274 pages; 36 papers
ISBN: 9780819483744
SPIE Members $80 Sale $64; Nonmembers $105 Sale $84
| Optical Science and Engineering |
Quantum and Nonlinear Optics
Editors: Qihuang Gong, Peking Univ. (China); Guang-Can Guo, Univ. of Science and Technology of China (China); Yuen-Ron Shen, Univ. of California, Berkeley (United States)
Vol. 7846 · 316 pages; 40 papers
ISBN: 9780819483768
SPIE Members $80 Sale $64; Nonmembers $105 Sale $84
All volumes below are 20% off during December. Click through the titles to view sale prices. New Conference Proceedings - 22 November 2010 | Aerospace, Defense, Remote Sensing, and Astronomy |
Remote Sensing for Agriculture, Ecosystems, and Hydrology XII
Editors: Christopher M. U. Neale, Utah State Univ. (United States); Antonino Maltese, Univ. degli Studi di Palermo (Italy)
Vol. 7824 · 574 pages; 61 papers
ISBN: 9780819483416
SPIE Members $125; Nonmembers $165
Remote Sensing of Clouds and the Atmosphere XV
Editors: Richard H. Picard, Air Force Research Lab. (United States); Klaus Schäfer, Karlsruhe Institute of Technology (Germany); Adolfo Comeron, Univ. Politècnica de Catalunya (Spain); Michiel van Weele, Koninklijk Nederlands Meteorologisch Instituut (Netherlands)
Vol. 7827 · 404 pages; 33 papers
ISBN: 9780819483447
SPIE Members $80; Nonmembers $105
Image and Signal Processing for Remote Sensing XVI
Editor: Lorenzo Bruzzone, Univ. degli Studi di Trento (Italy)
Vol. 7830 · 574 pages; 54 papers
ISBN: 9780819483478
SPIE Members $90; Nonmembers $120
Electro-Optical and Infrared Systems: Technology and Applications VII
Editors: David A. Huckridge, QinetiQ Ltd. (United Kingdom); Reinhard R. Ebert, Fraunhofer FOM (Germany)
Vol. 7834 · 300 pages; 31 papers
ISBN: 9780819483522
SPIE Members $70; Nonmembers $90
| Microelectronics, Optoelectronics, and Micromachining |
Proceedings of SPIE on CD-ROM
Photomask Technology 2010
Vol. CDS409 · 105 papers
ISBN: 9780819483386
SPIE Members $95; Nonmembers $130
| Optical Science and Engineering |
5th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optoelectronic Materials and Devices for Detector, Imager, Display, and Energy Conversion Technology
Editors: Yadong Jiang, Univ. of Electronic Science and Technology of China (China); Bernard Kippelen, Georgia Institute of Technology (United States); Junsheng Yu, State Key Lab. of Electronic Thin Films and Integrated Devices (China)
Vol. 7658 · 1372 pages; 215 papers
ISBN: 9780819480880
SPIE Members $155; Nonmembers $210
| Signal and Image Processing |
Unmanned/Unattended Sensors and Sensor Networks VII
Editor: Edward M. Carapezza, DARPA and Univ. of Connecticut (United States)
Vol. 7833 · 256 pages; 22 papers
ISBN: 9780819483515
SPIE Members $70; Nonmembers $90
New Conference Proceedings - 11 November 2010 | Aerospace, Defense, Remote Sensing, and Astronomy |
Adaptive X-Ray Optics
Editors: Ali M. Khounsary, Argonne National Lab. (United States); Stephen L. O'Dell, NASA Marshall Space Flight Ctr. (United States); Sergio R. Restaino, U.S. Naval Research Lab. (United States)
Vol. 7803 · 198 pages; 19 papers
ISBN: 9780819482990
SPIE Members $53; Nonmembers $70
Remote Sensing of the Ocean, Sea Ice, and Large Water Regions 2010
Editors: Charles R. Bostater, Jr., Florida Institute of Technology (United States); Stelios P. Mertikas, Technical Univ. of Crete (Greece); Xavier Neyt, Royal Belgian Military Academy (Belgium); Miguel Velez-Reyes, Univ. de Puerto Rico Mayagüez (United States) Vol. 7825 · 230 pages; 21 papers
ISBN: 9780819483423
SPIE Members $53; Nonmembers $70
Sensors, Systems, and Next-Generation Satellites XIV
Editors: Roland Meynart, European Space Research and Technology Ctr. (Netherlands); Steven P. Neeck, NASA Headquarters (United States); Haruhisa Shimoda, Japan Aerospace Exploration Agency (Japan)
Vol. 7826 · 754 pages; 71 papers
ISBN: 9780819483430
SPIE Members $120; Nonmembers $160
Optics in Atmospheric Propagation and Adaptive Systems XIII
Editors: Karin Stein, Fraunhofer Institute of Optronics, System Technologies and Image Exploitation IOSB (Germany); John D. Gonglewski, Air Force Research Lab. (United States)
Vol. 7828 · 226 pages; 22 papers
ISBN: 9780819483454
SPIE Members $53; Nonmembers $70
SAR Image Analysis, Modeling, and Techniques X
Editor: Claudia Notarnicola, EURAC-Institute for Applied Remote Sensing (Italy)
Vol. 7829 · 188 pages; 16 papers
ISBN: 9780819483461
SPIE Members $53; Nonmembers $70
Technologies for Optical Countermeasures VII
Editors: David H. Titterton, Defence Science and Technology Lab. (United Kingdom); Mark A. Richardson, Cranfield Univ. (United Kingdom)
Vol. 7836 · 218 pages; 23 papers
ISBN: 9780819483546
SPIE Members $53; Nonmembers $70
Millimetre Wave and Terahertz Sensors and Technology III
Editors: Keith A. Krapels, U.S. Army Night Vision & Electronic Sensors Directorate (United States); Neil A. Salmon, QinetiQ Ltd. (United Kingdom)
Vol. 7837 · 186 pages; 20 papers
ISBN: 9780819483553
SPIE Members $53; Nonmembers $70
Optics and Photonics for Counterterrorism and Crime Fighting VI and Optical Materials in Defence Systems Technology VII
Editors: Colin Lewis, Ministry of Defence (United Kingdom); Douglas Burgess, Burgess Consulting (United Kingdom); Roberto Zamboni, Consiglio Nazionale delle Ricerche (Italy); François Kajzar, Univ. d'Angers (France); Emily M. Heckman, Air Force Research Lab. (United States)
Vol. 7838 · 394 pages; 40 papers
ISBN: 9780819483560
SPIE Members $80; Nonmembers $105
Proceedings of SPIE on CD-ROM
Optics and Photonics 2010: Remote Sensing
Vol. CDS406 · 193 papers
ISBN: 9780819483225
SPIE Members $330; Nonmembers $435
Proceedings of SPIE on CD-ROM
Optics and Photonics 2010: Atmospheric and Space Optical Systems
Vol. CDS407 · 155 papers
ISBN: 9780819483232
SPIE Members $250; Nonmembers $330
| Electronic Imaging, Displays, and Medical Imaging |
Proceedings of SPIE on CD-ROM
Optics and Photonics 2010: Image and Signal Processing
Vol. CDS404 · 165 papers
ISBN: 9780819483201
SPIE Members $220; Nonmembers $295
Proceedings of SPIE on CD-ROM
Optics and Photonics 2010: X-Ray, Gamma-Ray, and Particle Technologies
Vol. CDS405 · 155 papers
ISBN: 9780819483218
SPIE Members $275; Nonmembers $365
| Microelectronics, Optoelectronics, and Micromachining |
Photomask Technology 2010
Editors: M. Warren Montgomery, CNSE/SEMATECH (United States); Wilhelm Maurer, Infineon Technologies AG (Germany)
Vol. 7823 · 1026 pages; 103 papers
ISBN: 9780819483379
SPIE Members $135; Nonmembers $180
Proceedings of SPIE on CD-ROM
Optics and Photonics 2010: Solar Energy and Technology
Vol. CDS401 · 112 papers
ISBN: 9780819483171
SPIE Members $235; Nonmembers $310
Proceedings of SPIE on CD-ROM
Optics and Photonics 2010: Photonic Devices and Applications
Vol. CDS402 · 163 papers
ISBN: 9780819483188
SPIE Members $450; Nonmembers $590
| Optical Science and Engineering |
5th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Advanced Optical Manufacturing Technologies
Editors: Li Yang, Institute of Optics and Electronics (China); Yoshiharu Namba, Chubu Univ. (Japan); David D. Walker, Univ. College London (United Kingdom); Shengyi Li, National Univ. of Defense Technology (China)
Vol. 7655 · 868 pages; 126 papers
ISBN: 9780819480859
SPIE Members $120; Nonmembers $160
5th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment
Editors: Yudong Zhang, Institute of Optics and Electronics (China); Jose M. Sasian, College of Optical Sciences, The Univ. of Arizona (United States); Libin Xiang, Academy of Opto-Electronics, Chinese Academy of Sciences (China); Sandy To, The Hong Kong Polytechnic Univ. (Hong Kong, China)
Vol. 7656 · 1862 pages; 271 papers
ISBN: 9780819480866
SPIE Members $195; Nonmembers $260
5th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Design, Manufacturing, and Testing of Micro- and Nano-Optical Devices and Systems
Editors: Tianchun Ye, Institute of Microelectronics (China); Sen Han, Veeco Instruments Inc. (United States); Masaomi Kameyama, Nikon Corp. (Japan); Song Hu, Institute of Optics and Electronics (China)
Vol. 7657 · 432 pages; 64 papers
ISBN: 9780819480873
SPIE Members $70; Nonmembers $90
Proceedings of SPIE on CD-ROM
International Optical Design Conference
Vol. CDS413 · 106 papers
ISBN: 9780819483614
SPIE Members $95; Nonmembers $120
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