SPIE Profiles

SPIE Profiles is an optics and photonics networking platform for professionals

Explore SPIE Profiles

Dr. Peter Takacs
Surface Metrology Solutions LLC
Fellow Member
Dr. Burn Lin
National Tsing Hua Univ
Fellow Member
Michael Wellfare
Polaris Sensor Technologies Inc
Individual Member
Jack Chen
NanoPatterning Technology Co Ltd
Student Member
Dr. Marco La Manna
Univ of Wisconsin-Madison
Early Career Professional
Prof. Kevin Tsia
Univ of Hong Kong
Individual Member

Get access to all the features on SPIE Profiles

Sign in to your SPIE Account

Send messages, follow, and view contact details
Email (or username)
Password

Create your own SPIE Profile

Sign up with a free account. You will be able to:
  • Manage your SPIE information
  • Stand out in the SPIE Conference app
  • See your activity with the Society
  • Message other Profiles users