SPIE Profiles

SPIE Profiles is an optics and photonics networking platform for professionals

Explore SPIE Profiles

Dr. Christoph Hohle
Fraunhofer-Institut für Photonische Mikrosysteme IPMS
Individual Member
Dr. Kent Rochford
SPIE
Individual Member
Dr. Haley Marks
California NanoSystems Institute, UCLA
Individual Member
Prof. Ton van Leeuwen
Amsterdam UMC
Fellow Member
Dr. Jue Wang
Corning Advanced Optics
Fellow Member
Dr. Jonathan Ellis
Edmund Optics
Individual Member

Get access to all the features on SPIE Profiles

Sign in to your SPIE Account

Send messages, follow, and view contact details

Create your own SPIE Profile

Sign up with a free account. You will be able to:
  • Manage your SPIE information
  • Stand out in the SPIE Conference app
  • See your activity with the Society
  • Message other Profiles users
PREMIUM CONTENT
Sign in to read the full article
Create a free SPIE account to get access to
premium articles and original research