Dr. William B. Spillman

Fellow Member | Retired
Spillman, William B.
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SPIE Membership: 27.3 years
SPIE Awards: Fellow status
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Area of Expertise: fiber optic sensing, smart structures, complex adaptive systems, biomedical image analysis
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Profile Summary

Dr. Spillman received his Ph.D. from Northeastern University in 1977 in experimental solid state physics. The title of his thesis was "Low-Temperature High-Pressure Dielectric Measurements of the Paraelectric-Ferroelectric Phase Transition in the Hydrogen-Bonded Arsenates and their Deuterated Isomorphs." Since that time he worked in industry at the Sperry Corporate Research Center, Geo-Centers, Inc., Hercules Inc. and the Goodrich Corporation prior to joining Virginia Tech as an Associate Professor of Physics and Director of the Virginia Tech Applied Biosciences Center in 1999. He has now retired from Virginia Tech but remains active as a technical consultant to a number of firms and as an expert witness. He has been awarded 44 US and 50 non-US patents and is the author or co-author of more than 170 technical publications, 16 book chapters and edited proceedings, and 2 video short courses. He is a co-editor of the CRC Press Sensors Series of Monographs and has served on the editorial boards of the Journals: Measurement Science & Technology, Optical Engineering, Smart Materials and Structures, Journal of Optics A: Pure and Applied Optics and the International Journal of Optomechatronics. He is a fellow of both the SPIE and the Institute of Physics in the U.K.

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