Dr. Robert P. Loce

Fellow Member | Patent Technical SPecialist at Datto Inc
Loce, Robert P.
SPIE Leadership: Retrieving Data, please wait...
SPIE Membership: 15.2 years total | 15.2 years voting
SPIE Awards: Fellow status
SPIE Involvement: Retrieving Data, please wait...
Area of Expertise: Image Processing, Computer Vision, Video Processing, Intellectual Property, Imaging Systems
Contact Details:
Sign In to send a private message or view contact details

Profile Summary

Robert Loce is a Research Fellow and Technical Manager in the Xerox Research Center Webster. He joined Xerox in 1981 with an Associate degree in Optical Engineering Technology from Monroe Community College. While working in optical and imaging technology and research departments at Xerox, he received a BS in Photographic Science (RIT 1985), an MS in Optical Engineering (UR 1987), a PhD in Imaging Science (RIT 1993), and passed the US Patent Bar (2002). A significant portion of his earlier career was devoted to development of image processing methods for color electronic printing. His current research activities involve leading an organization and projects into new computer vision and video technologies that are relevant to transportation, healthcare,retail, and surveillance. He has publications and many patents in the areas of digital image processing, image enhancement, imaging systems, optics and halftoning. He is a Fellow of SPIE and a Senior Member of IEEE. His publications include a book on enhancement and restoration of digital documents, and book chapters on digital halftoning and digital document processing. He is currently an associate editor for Journal of Electronic Imaging, and has been an associate editor for Real-Time Imaging, and IEEE Transactions on Image Processing.

SPIE Volunteer Activities

Retrieving Data, please wait...

Upcoming Presentations

Most Recent | Show All
Retrieving Data, please wait...

Publications

Most Recent | Show All
Retrieving Data, please wait...

Conference Committee Involvement

Most Recent | Show All
Retrieving Data, please wait...

Course Instructor

Most Recent | Show All
Retrieving Data, please wait...
PREMIUM CONTENT
Sign in to read the full article
Create a free SPIE account to get access to
premium articles and original research
Forgot your username?
close_icon_gray