Dr. Reinhard Völkel

Fellow Member | CEO at Focuslight Switzerland SA
Völkel, Reinhard
SPIE Leadership: Retrieving Data, please wait...
SPIE Membership: 16.3 years
SPIE Awards: Fellow status | Senior status | 2020 SPIE Community Champion | 2019 SPIE Community Champion
SPIE Involvement: Retrieving Data, please wait...
Area of Expertise: micro-optics, start-ups, illumination, wafer-level optics, automotive lighting, lithography
Websites: Company Website
Social Media: LinkedIn | Twitter | Twitter | LinkedIn | Facebook | LinkedIn
Contact Details:
Sign In to send a private message or view contact details

Profile Summary

Executive with profound background in technology and digital. Strong interpersonal and networking skills, inspirational leadership, strategic thinking, and execution skills. Experienced with all stages of the development cycle of innovative startups, scaleups and tech companies.

General Management, Technology Management, Research & Development, Strategic Planning, Business Development, Project Management, Relationship Development, Intellectual Property, Quality Assurance, Problem Resolution, Communications, Technical Publications, Technical Presentations and Finance.

Expert Innosuisse - Suisse Innovation Agency
SPIE Fellow, OSA Senior Member, Member of EOS, DGAO, SSOM, Swissmem, Swissphotonics and Sand Hill Angels.

Technical: Photonics, Nanotechnology, Engineering, Micro-Optical Elements, Microlens Arrays, Optical Design, Optical Interconnections, Fiber Optics, Telecom, Datacom, Silicon Photonics, Optical Bio-Chips, Chemical Micro-Chips, Optical Sensors, Metrology, MEMS, MOEMS, Bio-MEMS, Microfluidic, Laser, Med-Tech, Data Sciences, Big Data, Miniaturized Cameras, Ultra-Flat Cameras, Wafer-Level Cameras, Wafer-Level Packaging, Wafer-Based Micro-Fabrication.

Upcoming Presentations

Most Recent | Show All
Retrieving Data, please wait...


Most Recent | Show All
Retrieving Data, please wait...

Conference Committee Involvement

Most Recent | Show All
Retrieving Data, please wait...

Course Instructor

Most Recent | Show All
Retrieving Data, please wait...
Sign in to read the full article
Create a free SPIE account to get access to
premium articles and original research