Ray Williamson

Fellow Member | Consulting Engineer at Ray Williamson Consulting
Williamson, Ray
SPIE Leadership: Retrieving Data, please wait...
SPIE Membership: 27.7 years
SPIE Awards: Fellow status | Senior status | 2019 SPIE Community Champion
SPIE Involvement: Retrieving Data, please wait...
Area of Expertise: optical fabrication, technician training, quality and testing methods, waveplates and polarization, laser optics, technical writing
Websites: Company Website
Social Media: LinkedIn | LinkedIn
Contact Details:
Sign In to send a private message or view contact details

Profile Summary

Ray Williamson is an optical engineering consultant with concentration in optical fabrication, metrology, and polarization optics. He has worked hands-on as an optician on a broad range of materials, sizes, and configurations – in both prototype and production quantities – and has trained many opticians. He has worked as process engineer, quality manager, and engineering manager, at Spectra-Physics, Coherent, Los Alamos, Laser Power, and VLOC.

He is a voting member of the Optical and Electro-Optics Standards Committee representing U.S. interests to ISO, board member of the Florida Photonics Cluster, member of SPIE (an international society for photonics), OSA (Optical Society of America), and APOMA (American Precision Optics Manufacturers Association). He has published over twenty papers on optical fabrication and testing, and is Optical Manufacturing and Testing Conference Co-Chair for SPIE. He is the author of the SPIE Field Guide to Optical Fabrication.

In the last nine years he has supported himself through consulting services to the precision optics community, which has included two formal training programs under grant; one for Florida and one for New York.

Upcoming Presentations

Most Recent | Show All
Retrieving Data, please wait...


Most Recent | Show All
Retrieving Data, please wait...

Conference Committee Involvement

Most Recent | Show All
Retrieving Data, please wait...

Course Instructor

Most Recent | Show All
Retrieving Data, please wait...
Sign in to read the full article
Create a free SPIE account to get access to
premium articles and original research