Dr. Prashant K. Kulshreshtha

Senior Manager Process Engineering at Applied Materials Inc
Kulshreshtha, Prashant K.
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SPIE Membership: 1.0 years
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Area of Expertise: E-beam Lithography, Pattern Design, Resist Characterization, EUV Patterning/Lithogrpahy, Nanoscale Mechanical Property, Silicon device fabrication and characterization
Websites: Company Website
Social Media: LinkedIn
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Profile Summary

Prashant K Kulshreshtha is Postdoctoral Fellow for Nanoscale property measurement at Molecular Foundry, LBNL. He is currently working with Dr. Deirdre Olynick (Scientist) and Dr. Paul Ashby (Scientist) on a Intel Corp. funded Molecules for Advanced Patterning (MAP) Project to understand and mitigate the pattern collapse in sub-20 nm lithography. He received his Ph.D. in Material Science and Engineering from the North Carolina State University, Raleigh in December 2011. His research interests include developing new scanning probe tools and methods to characterize the mechanical and surface properties of high resolution resist systems.

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