Dr. Kenneth W. Tobin

Fellow Member | Director / Corporate Research Fellow at Oak Ridge National Lab
Tobin, Kenneth W.
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SPIE Membership: 23.8 years total | 23.8 years voting
SPIE Awards: Fellow status
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Area of Expertise: Computer vision, Instrumentation, Pattern recognition, Metrology, Radiography, Image processing
Websites: Company Website
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Profile Summary

Dr. Tobin is the Director of the Measurement Science and Systems Engineering (MSSE) Division at the Oak Ridge National Laboratory (ORNL), Oak Ridge, Tennessee, USA, where he has been working in various R&D capacities since 1987. He has extensive experience in R&D, R&D leadership, management, and strategic organization and planning. The MSSE Division is composed of 160 research, technical, and administrative staff who perform R&D in measurement science associated with electronics, sensors, signals, communications, and integrated systems. As Director, he is responsible for the strategic direction of the organization and for supporting the mission areas of the U.S. Department of Energy and ORNL.

Dr. Tobin was named an ORNL Corporate Research Fellow in 2003 for his contributions to the field of applied computer vision research that addressed industrial and economic competitiveness, biomedical measurement science, and national security. He has authored and co-authored over 135 publications and he currently holds ten U.S. Patents with three additional patents pending in areas of computer vision, photonics, radiography, and microscopy. Dr. Tobin is a Fellow of the International Society for Optics and Photonics (SPIE) where he is currently an Associate Editor for the Journal of Electronic Imaging. He is also a Senior Member of the Institute of Electrical and Electronics Engineers. He was the recipient of the R&D 100 Award by R&D Magazine in 2002 and again in 2010 for his work in content-based image retrieval applied to both industry and biomedicine. He was the Tennessee Academy of Science Industrial Scientist of the Year in 2000 for his Leadership and Scientific Contributions to Semiconductor Metrology.

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