Dr. Jovan G. Brankov

Individual Member | Professor at Illinois Institute of Technology
Brankov, Jovan G.
SPIE Leadership: Retrieving Data, please wait...
SPIE Membership: 13.7 years
SPIE Awards: 2020 SPIE Community Champion | 2019 SPIE Community Champion
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Area of Expertise: phase contrast imaging, image quality assessment, model observer, image processing, machine learning
Websites: Company Website | Company Website
Social Media: LinkedIn
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Profile Summary

Dr. Brankov is a Professor in ECE/BME Department at the Illinois Institute of Technology. His research interests include medical imaging (software and hardware), machine learning and data mining. His current research topics include: medical image quality assessment based on a human-observer model, multiple-image radiography (a new phase-sensitive x-ray imaging method), 4D and 5D tomographic image reconstruction methods for medical image sequences and deep learning in medical imaging. He established the Advanced X-ray Imaging Laboratory (AXIL) at IIT, which is currently developing a phase-sensitive x-ray device.
His is currently serving as: associate editor for IEEE Transactions on Biomedical Engineering, Medical Physics (AAPM) and Journal of Electronic Imaging (SPIE and IS&T), program committee member for IEEE International Symposium on Biomedical Imaging and SPIE Image Perception conferences and review on SBIB (10) NIH panel. He is a member of SPIE, Sigma Xi and senior member of IEEE technical communities.

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