Dr. Jangho Shin

Senior Member | Manager, Senior Field Apps Engineer
SPIE Leadership: Retrieving Data, please wait...
SPIE Membership: 15.5 years
SPIE Awards: Senior status
SPIE Involvement: Retrieving Data, please wait...
Area of Expertise: Semiconductor Processing, Optical Lithography, Alignment, Overlay Metrology, Computational lithography, Defect inspection metrology
Contact Details:
Sign In to send a private message or view contact details

Profile Summary

Jangho (Jerry) Shin is presently a senior manager of field apps engineering at ASML Korea. He was a researcher/manager at Samsung semiconductor R&D and is a Senior member of SPIE. Dr. Shin received his PhD in electrical and computer engineering from the University of Wisconsin at Madison in 2003.

Upcoming Presentations

Most Recent | Show All
Retrieving Data, please wait...

Publications

Most Recent | Show All
Retrieving Data, please wait...

Conference Committee Involvement

Most Recent | Show All
Retrieving Data, please wait...

Course Instructor

Most Recent | Show All
Retrieving Data, please wait...
PREMIUM CONTENT
Sign in to read the full article
Create a free SPIE account to get access to
premium articles and original research
Forgot your username?
close_icon_gray