Dr. Jan Burke

Group Leader, Image-based Measurement Systems at Fraunhofer IOSB
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SPIE Membership: 1.0 years
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Area of Expertise: interferometry, phase shifting, precision calibrations, speckle interferometry, fringe analysis
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Profile Summary

Jan Burke received his Ph.D. from the university of Oldenburg, Germany, in 2000, with a thesis on "Application and Optimisation of the Spatial Phase Shifting Technique in Digital Speckle Interferometry". He then spent a year with MetroLaser Inc., Irvine, CA, where he worked on diverse research projects in optical metrology, such as laser vibrometry, digital holography, and phase-shifting fringe projection. In 2002 he joined the metrology team at the Australian Centre for Precision Optics (ACPO) at the Commonwealth Scientific and Industrial Research Organisation (CSIRO), Sydney, Australia, as a Senior Research Scientist. His current research activities include the development of new methods for phase-shifting interferometry, phase-map stitching, sphere and asphere metrology, three-flat testing, and various other characterisation issues in precision optics.

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