Prof. James C. Wyant
Fellow Member |
Professor
at Wyant College of Optical Sciences
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SPIE Leadership:
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SPIE Membership:
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26.1 years 
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SPIE Awards:
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Fellow status | 2019 SPIE Community Champion | 2019 Visionary Award | 2010 Chandra S. Vikram Award in Optical Metrology | 2003 Gold Medal | 1979 Directors' Award
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SPIE Involvement:
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Area of Expertise:
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Interferometry, Holography, Optical Testing
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Websites:
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Company Website
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Social Media:
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LinkedIn
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Twitter
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Contact Details:
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My major research and development interests involve using old technology, interferometry, and new technology, computers and modern electronics, to produce "state of the art" instruments for solving metrology problems in many industries including data storage, semiconductor, machine tool, optical fabrication, fiber optics, printing, and biomedical.
I am interested in technical education, especially on the web or by computer.
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Conference Committee Involvement
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Course Instructor
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